Inventor · disambiguated record
Wei-Ming You
Also filed as: YOU WEI-MING
28 granted patents·4 pending applications·66 citations·filing 2001–2024
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD20TAIWAN SEMICONDUCTOR MFG8CHANG LAN FANG2LIN YU-TING1SHIH YU-SHEN1
Top patents by PatentIndex Score
32 records- 0194US9577102B1Method of forming gate and finFETTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Feb 21, 2017·18 cites·19 claims
- 0291US9406675B1FinFET structure and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 2, 2016·7 cites·20 claims
- 0390US11145751B2Semiconductor structure with doped contact plug and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 12, 2021·6 cites·20 claims
- 0485US12015055B2Doping for semiconductor device with conductive featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 18, 2024·0 cites·20 claims
- 0581US11742386B2Doping for semiconductor device with conductive featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 29, 2023·0 cites·20 claims
- 0681US11018022B2Method for forming semiconductor device structure having oxide layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 25, 2021·2 cites·20 claims
- 0778US10347720B2Doping for semiconductor device with conductive featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 9, 2019·1 cites·20 claims
- 0878US2024395564A1Semiconductor device structure having gate dielectric layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0977US10192985B2FinFET with doped isolation insulating layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 29, 2019·3 cites·20 claims
- 1076US11450741B2Doping for semiconductor device with conductive featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 20, 2022·0 cites·20 claims
- 1176US8652868B2Implanting method for forming photodiodeSHIH YU-SHEN·Filed 2012·Granted Feb 18, 2014·3 cites·20 claims
- 1274US7973293B2Implantation quality improvement by xenon/hydrogen dilution gasTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Jul 5, 2011·6 cites·20 claims
- 1373US8628998B2Annealing methods for backside illumination image sensor chipsLIN YU-TING·Filed 2012·Granted Jan 14, 2014·3 cites·16 claims
- 1470US12266543B2Semiconductor device structure having gate dielectric layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 1, 2025·0 cites·20 claims
- 1567US9508548B2Method for forming barrier layer for dielectric layers in semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Nov 29, 2016·1 cites·20 claims
- 1665US11024716B2Semiconductor structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 1, 2021·0 cites·20 claims
- 1765US10950694B2Doping for semiconductor device with conductive featureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 16, 2021·0 cites·20 claims
- 1859US7368303B2Method for temperature control in a rapid thermal processing systemTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted May 6, 2008·7 cites·20 claims
- 1958US10504998B2Semiconductor structure and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 10, 2019·0 cites·18 claims
- 2056US8129203B2Auto feedback apparatus for laser markingCHANG LAN FANG·Filed 2009·Granted Mar 6, 2012·1 cites·7 claims
- 2155US10453933B2Barrier layer for dielectric layers in semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Oct 22, 2019·0 cites·20 claims
- 2254US9768261B2Semiconductor structure and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Sep 19, 2017·0 cites·20 claims
- 2354US9716090B2FinFet structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 25, 2017·0 cites·20 claims
- 2452US10062787B2FinFETTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Aug 28, 2018·0 cites·20 claims
- 2550US6710889B2Method for improved dielectric layer metrology calibrationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 23, 2004·6 cites·20 claims
- 2649US8860101B2Image sensor cross-talk reduction systemCHANG LAN FANG·Filed 2012·Granted Oct 14, 2014·0 cites·20 claims
- 2747US6777251B2Metrology for monitoring a rapid thermal annealing processTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Aug 17, 2004·2 cites·17 claims
- 2844US2015372099A1Contact silicide formation using a spike annealing processTAIWAN SEMICONDUCTOR MFG·Filed 2014·Application pending·0 cites
- 2940US9697989B2Method for generating parameter pattern, ion implantation method and feed forward semiconductor manufacturing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jul 4, 2017·0 cites·17 claims
- 3036US2004043617A1Partitioned wafer boat for constant wafer backside emmissivityTAIWAN SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
- 3135US2003230323A1Apparatus and method for improving scrubber cleaningTAIWAN SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
- 3230US6647998B2Electrostatic charge-free solvent-type dryer for semiconductor wafersTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Nov 18, 2003·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →