Inventor · disambiguated record
Kaviyesh Doshi
Also filed as: DOSHI KAVIYESH · DOSHI KAVIYESH B
10 granted patents·2 pending applications·285 citations·filing 2009–2019
88Inventor score
Top patents by PatentIndex Score
12 records- 0198US8566058B2Method for de-embedding device measurementsPUPALAIKIS PETER J·Filed 2009·Granted Oct 22, 2013·130 cites·18 claims
- 0297US9366743B2Time domain network analyzerTELEDYNE LECROY INC·Filed 2014·Granted Jun 14, 2016·129 cites·24 claims
- 0394US9231608B1Method and apparatus for correction of time interleaved ADCsTELEDYNE LECROY INC·Filed 2015·Granted Jan 5, 2016·16 cites·17 claims
- 0482US8706433B2Time domain reflectometry step to S-parameter conversionPUPALAIKIS PETER J·Filed 2011·Granted Apr 22, 2014·4 cites·20 claims
- 0575US8659315B2Method for printed circuit board trace characterizationPUPALAIKIS PETER J·Filed 2012·Granted Feb 25, 2014·3 cites·18 claims
- 0674US8843335B2Wavelet denoising for time-domain network analysisPUPALAIKIS PETER J·Filed 2010·Granted Sep 23, 2014·2 cites·33 claims
- 0773US10534019B2Variable resolution oscilloscopeTELEDYNE LECROY INC·Filed 2017·Granted Jan 14, 2020·1 cites·18 claims
- 0864US10725070B2Variable resolution oscilloscopeTELEDYNE LECROY INC·Filed 2019·Granted Jul 28, 2020·0 cites·18 claims
- 0960US10396907B2Time domain reflectometry step to S-parameter conversionTELEDYNE LECROY INC·Filed 2017·Granted Aug 27, 2019·0 cites·12 claims
- 1057US8706438B2Time domain network analyzerPUPALAIKIS PETER J·Filed 2011·Granted Apr 22, 2014·0 cites·13 claims
- 1152US2014098848A1Time Domain Reflectometry Step to S-Parameter ConversionTELEDYNE LECROY INC·Filed 2013·Application pending·0 cites
- 1240US2014343883A1User Interface for Signal Integrity Network AnalyzerTELEDYNE LECROY INC·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →