Inventor · disambiguated record
Holger Schulze
Also filed as: SCHULZE HOLGER
37 granted patents·2 pending applications·104 citations·filing 1975–2023
96Inventor score
Files withINFINEON TECHNOLOGIES AG23INFINEON TECHNOLOGIES AUSTRIA3INFINEON TECHNOLOGIES AUSTRIA AG3ITI SCOTLAND LTD2MAUDER ANTON2
Top patents by PatentIndex Score
39 records- 0194US7514750B2Semiconductor device and fabrication method suitable thereforINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 7, 2009·22 cites·10 claims
- 0293US9613805B1Method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2015·Granted Apr 4, 2017·9 cites·22 claims
- 0392US7842590B2Method for manufacturing a semiconductor substrate including laser annealingINFINEON TECHNOLOGIES AUSTRIA·Filed 2008·Granted Nov 30, 2010·23 cites·21 claims
- 0487US8367532B2Semiconductor device and fabrication methodINFINEON TECHNOLOGIES AG·Filed 2012·Granted Feb 5, 2013·5 cites·23 claims
- 0585US9558948B1Laser thermal annealing of deep doped region using structured antireflective coatingINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2016·Granted Jan 31, 2017·4 cites·20 claims
- 0685US8921931B2Semiconductor device with trench structures including a recombination structure and a fill structureMAUDER ANTON·Filed 2012·Granted Dec 30, 2014·6 cites·20 claims
- 0782US9570542B2Semiconductor device including a vertical edge termination structure and method of manufacturingINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 14, 2017·4 cites·15 claims
- 0879US8003502B2Semiconductor device and fabrication methodINFINEON TECHNOLOGIES AUSTRIA·Filed 2009·Granted Aug 23, 2011·4 cites·22 claims
- 0971US3996452AMethod for optimizing a controlled system parameterSIEMENS AG·Filed 1975·Granted Dec 7, 1976·18 cites·10 claims
- 1070US10957764B2Vertical semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2015·Granted Mar 23, 2021·2 cites·9 claims
- 1169US9777337B2Detecting analytesITI SCOTLAND LTD·Filed 2012·Granted Oct 3, 2017·1 cites·40 claims
- 1266US9887125B2Method of manufacturing a semiconductor device comprising field stop zoneINFINEON TECHNOLOGIES AG·Filed 2014·Granted Feb 6, 2018·1 cites·21 claims
- 1366US9362349B2Semiconductor device with charge carrier lifetime reduction meansINFINEON TECHNOLOGIES AG·Filed 2013·Granted Jun 7, 2016·2 cites·31 claims
- 1465US10651037B2Method for fabricating a doped zone in a semiconductor bodySCHULZE HANS JOACHIM·Filed 2005·Granted May 12, 2020·2 cites·12 claims
- 1562US10998402B2Semiconductor devices with steep junctions and methods of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2019·Granted May 4, 2021·0 cites·20 claims
- 1661US9123828B2Semiconductor device and method for forming a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2013·Granted Sep 1, 2015·1 cites·17 claims
- 1760US10777506B2Silicon carbide semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2019·Granted Sep 15, 2020·0 cites·13 claims
- 1858US9972689B2Semiconductor device having a surface with ripplesINFINEON TECHNOLOGIES AG·Filed 2014·Granted May 15, 2018·0 cites·10 claims
- 1956US10069016B2Semiconductor diode with trench structures and including doped layers and doped zones of opposite conductivity types providing high surge energy capacityINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2014·Granted Sep 4, 2018·0 cites·25 claims
- 2055US10475881B2Semiconductor devices with steep junctions and methods of manufacturing thereofINFINEON TECHNOLOGIES AG·Filed 2017·Granted Nov 12, 2019·0 cites·21 claims
- 2155US7364884B2Method for producing a hydroxylation catalyst and the use thereofBASF AG·Filed 2004·Granted Apr 29, 2008·0 cites·6 claims
- 2254US10049912B2Method of manufacturing a semiconductor device having a vertical edge termination structureINFINEON TECHNOLOGIES AG·Filed 2017·Granted Aug 14, 2018·0 cites·15 claims
- 2354US8895453B2Semiconductor device with an insulation layer having a varying thicknessINFINEON TECHNOLOGIES AG·Filed 2013·Granted Nov 25, 2014·0 cites·23 claims
- 2454US8252671B2Semiconductor device and fabrication methodMAUDER ANTON·Filed 2011·Granted Aug 28, 2012·0 cites·22 claims
- 2553US12513921B2Semiconductor device including a field stop regionINFINEON TECHNOLOGIES AG·Filed 2022·Granted Dec 30, 2025·0 cites·19 claims
- 2652US12249551B2Power semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2022·Granted Mar 11, 2025·0 cites·21 claims
- 2752US10475743B2Semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2017·Granted Nov 12, 2019·0 cites·25 claims
- 2851US11410950B2Semiconductor substrate having a bond pad material based on aluminumINFINEON TECHNOLOGIES AG·Filed 2020·Granted Aug 9, 2022·0 cites·18 claims
- 2951US2024154020A1Semiconductor device including active diode areaINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 3049US12426331B2Power semiconductor device and method of producing a power semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2022·Granted Sep 23, 2025·0 cites·17 claims
- 3147US8741750B2Method for fabricating a semiconductor having a graded pn junctionHILLE FRANK·Filed 2009·Granted Jun 3, 2014·0 cites·23 claims
- 3247US2011077166A1Surface attachmentITI SCOTLAND LTD·Filed 2009·Application pending·0 cites
- 3346US11437471B2Power semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2020·Granted Sep 6, 2022·0 cites·19 claims
- 3446US9595619B2Semiconductor device with different contact regionsINFINEON TECHNOLOGIES AG·Filed 2015·Granted Mar 14, 2017·0 cites·15 claims
- 3545US9385181B2Semiconductor diode and method of manufacturing a semiconductor diodeINFINEON TECHNOLOGIES AG·Filed 2014·Granted Jul 5, 2016·0 cites·12 claims
- 3641US9825136B2Semiconductor component and integrated circuitINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2015·Granted Nov 21, 2017·0 cites·16 claims
- 3741US7754590B2Method of manufacturing a semiconductor device comprising a field stop zone at a specific depthINFINEON TECHNOLOGIES AUSTRIA·Filed 2006·Granted Jul 13, 2010·0 cites·34 claims
- 3839US10585913B2Apparatus and method for distributed query processing utilizing dynamically generated in-memory term mapsDATAMEER INC·Filed 2017·Granted Mar 10, 2020·0 cites·6 claims
- 3937US8778157B2Detecting analytesSCHULZE HOLGER·Filed 2009·Granted Jul 15, 2014·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →