Inventor · disambiguated record
Bert Verstraeten
Also filed as: VERSTRAETEN BERT
8 granted patents·10 citations·filing 2017–2022
79Inventor score
Files withASML NETHERLANDS BV8
Top patents by PatentIndex Score
8 records- 0197US12007697B2Method for process metrologyASML NETHERLANDS BV·Filed 2022·Granted Jun 11, 2024·4 cites·20 claims
- 0284US11385551B2Method for process metrologyASML NETHERLANDS BV·Filed 2017·Granted Jul 12, 2022·2 cites·21 claims
- 0382US10747122B2Method of measuring a parameter of a device manufacturing process, metrology apparatus, substrate, target, device manufacturing system, and device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Aug 18, 2020·2 cites·20 claims
- 0472US10677589B2Substrate, metrology apparatus and associated methods for a lithographic processASML NETHERLANDS BV·Filed 2018·Granted Jun 9, 2020·1 cites·20 claims
- 0567US11506566B2Method of processing data, method of obtaining calibration dataASML NETHERLANDS BV·Filed 2018·Granted Nov 22, 2022·1 cites·20 claims
- 0664US10871367B2Substrate, metrology apparatus and associated methods for a lithographic processASML NETHERLANDS BV·Filed 2020·Granted Dec 22, 2020·0 cites·20 claims
- 0751US10571363B2Method of determining an optimal focus height for a metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Feb 25, 2020·0 cites·20 claims
- 0845US11054754B2Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Jul 6, 2021·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Bert Verstraeten files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →