Inventor · disambiguated record
Keiichiro Hitomi
Also filed as: HITOMI KEIICHIRO
15 granted patents·9 pending applications·31 citations·filing 2007–2025
88Inventor score
Top patents by PatentIndex Score
24 records- 0183US12314355B2Information processing system, device, and authentication methodHITOMI KEIICHIRO·Filed 2022·Granted May 27, 2025·1 cites·7 claims
- 0280US7612334B2Standard reference component for calibration, fabrication method for the same, and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 3, 2009·5 cites·15 claims
- 0379US8263929B2Standard member for correction, scanning electron microscope using same, and scanning electron microscope correction methodNAKAYAMA YOSHINORI·Filed 2009·Granted Sep 11, 2012·6 cites·20 claims
- 0478US7875850B2Standard component for calibration and electron-beam system using the sameHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 25, 2011·8 cites·13 claims
- 0575US7750296B2Scanning electron microscope and calibration of image distortionHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 6, 2010·3 cites·9 claims
- 0674US10416940B2Image processing apparatus, image processing system, and image processing method for interpreting content obtained from a web browser and displaying a screen based on the interpreted contentASAKIMORI HIROKI·Filed 2018·Granted Sep 17, 2019·2 cites·14 claims
- 0773US11394844B2Authentication system, shared terminal, and authentication methodHAN XIAOFENG·Filed 2020·Granted Jul 19, 2022·1 cites·13 claims
- 0870US9110384B2Scanning electron microscopeOMORI SEIKO·Filed 2011·Granted Aug 18, 2015·3 cites·8 claims
- 0963US10546017B2Displaying terms having corresponding character strings on a displayHITOMI KEIICHIRO·Filed 2018·Granted Jan 28, 2020·1 cites·10 claims
- 1063US2025253122A1Measurement device and scanning image acquisition methodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 1161US8637820B2Scanning electron microscope and inspection method using sameSOHDA YASUNARI·Filed 2011·Granted Jan 28, 2014·1 cites·19 claims
- 1260US2025239430A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 1359US2023094023A1Charged particle beam image processing device and charged particle beam apparatus including the sameHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1455US11626266B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Apr 11, 2023·0 cites·7 claims
- 1555US11276548B2Charged particle beam device and charged particle beam adjustment methodHITACHI HIGH TECH CORP·Filed 2020·Granted Mar 15, 2022·0 cites·13 claims
- 1651US2025003898A1Foreign object height measurement method and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1750US2011208477A1Measuring method of pattern dimension and scanning electron microscope using sameHITOMI KEIICHIRO·Filed 2009·Application pending·0 cites
- 1848US2025132123A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1947US7683313B2Charged particle beam measurement equipment, size correction and standard sample for correctionHITACHI HIGH TECH CORP·Filed 2008·Granted Mar 23, 2010·0 cites·5 claims
- 2041US9200896B2Pattern dimension measurement method and charged particle beam microscope used in sameHITOMI KEIICHIRO·Filed 2010·Granted Dec 1, 2015·0 cites·22 claims
- 2140US2021377250A1Authentication system, device, and authentication methodHITOMI KEIICHIRO·Filed 2021·Application pending·0 cites
- 2240US2022294929A1Information processing system, information processing apparatus, recording medium, and methodHITOMI KEIICHIRO·Filed 2022·Application pending·0 cites
- 2332US8478021B2Charged beam deviceSHIRAHATA KAORI·Filed 2010·Granted Jul 2, 2013·0 cites·15 claims
- 2431US2018068345A1Information processing apparatus, method of processing information, and storage mediumHIROKAWA TATSUMA·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →