Inventor · disambiguated record
Takahiro Ichinomiya
Also filed as: ICHINOMIYA TAKAHIRO
13 granted patents·3 pending applications·168 citations·filing 1997–2017
91Inventor score
Top patents by PatentIndex Score
16 records- 0190US6440780B1Method of layout for LSIMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Aug 27, 2002·87 cites·20 claims
- 0284US7336116B2Clock supply circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Feb 26, 2008·14 cites·10 claims
- 0381US7480875B2Method of designing a semiconductor integrated circuitPANASONIC CORP·Filed 2005·Granted Jan 20, 2009·12 cites·6 claims
- 0479US7225418B2Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 29, 2007·25 cites·38 claims
- 0574US9766640B2Semiconductor integrated circuit and power supply control system provided with a plurality of semiconductor integrated circuitsSOCIONEXT INC·Filed 2016·Granted Sep 19, 2017·2 cites·11 claims
- 0666US7278124B2Design method for semiconductor integrated circuit suppressing power supply noiseMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Oct 2, 2007·13 cites·22 claims
- 0762US7579864B2Logic block control system and logic block control methodPANASONIC CORP·Filed 2006·Granted Aug 25, 2009·4 cites·8 claims
- 0857US8271117B2Fabrication system of semiconductor integrated circuit, fabrication device, fabrication method, integrated circuit and communication systemICHINOMIYA TAKAHIRO·Filed 2008·Granted Sep 18, 2012·2 cites·11 claims
- 0953US7017135B2Method of designing semiconductor integrated circuit utilizing a scan test functionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 21, 2006·4 cites·4 claims
- 1052US9880572B2Semiconductor integrated circuit and power supply control system provided with a plurality of semiconductor integrated circuitsSOCIONEXT INC·Filed 2017·Granted Jan 30, 2018·0 cites·2 claims
- 1147US7996657B2Reconfigurable computing circuitPANASONIC CORP·Filed 2008·Granted Aug 9, 2011·0 cites·15 claims
- 1247US2009106721A1Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-outPANASONIC CORP·Filed 2008·Application pending·0 cites
- 1343US2005256921A1Delay calculation method, timing analysis method, calculation object network approximation method, and delay control methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 1438US6282506B1Method of designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Aug 28, 2001·5 cites·9 claims
- 1536US8143913B2Semiconductor integrated circuit, semiconductor integrated circuit control method, and terminal systemICHINOMIYA TAKAHIRO·Filed 2008·Granted Mar 27, 2012·0 cites·15 claims
- 1634US2005114054A1Method for analyzing power supply noise of semiconductor integrated circuitFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →