Inventor · disambiguated record
John G. Massey
Also filed as: MASSEY JOHN G · MASSEY JOHN GREG
21 granted patents·2 pending applications·44 citations·filing 2006–2022
92Inventor score
Top patents by PatentIndex Score
23 records- 0196US11309383B1Quad-layer high-k for metal-insulator-metal capacitorsIBM·Filed 2020·Granted Apr 19, 2022·4 cites·25 claims
- 0288US10989754B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Apr 27, 2021·2 cites·13 claims
- 0388US10564214B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Feb 18, 2020·2 cites·12 claims
- 0487US9739824B2Optimization of integrated circuit reliabilityIBM·Filed 2016·Granted Aug 22, 2017·2 cites·10 claims
- 0582US8120356B2Measurement methodology and array structure for statistical stress and test of reliabilty structuresAGARWAL KANAK B·Filed 2009·Granted Feb 21, 2012·11 cites·25 claims
- 0677US7375371B2Structure and method for thermally stressing or testing a semiconductor deviceIBM·Filed 2006·Granted May 20, 2008·9 cites·18 claims
- 0772US10996259B2Optimization of integrated circuit reliabilityIBM·Filed 2020·Granted May 4, 2021·0 cites·17 claims
- 0872US7868640B2Array-based early threshold voltage recovery characterization measurementIBM·Filed 2008·Granted Jan 11, 2011·6 cites·20 claims
- 0971US11054459B2Optimization of integrated circuit reliabilityIBM·Filed 2019·Granted Jul 6, 2021·0 cites·15 claims
- 1071US9041428B2Placement of storage cells on an integrated circuitIBM·Filed 2013·Granted May 26, 2015·3 cites·19 claims
- 1169US11594596B2Back-end-of-line compatible metal-insulator-metal on-chip decoupling capacitorIBM·Filed 2021·Granted Feb 28, 2023·0 cites·10 claims
- 1266US9043683B2Error protection for integrated circuitsIBM·Filed 2013·Granted May 26, 2015·3 cites·15 claims
- 1361US11038013B2Back-end-of-line compatible metal-insulator-metal on-chip decoupling capacitorIBM·Filed 2019·Granted Jun 15, 2021·0 cites·9 claims
- 1460US10627529B2Real time X-ray dosimeter using diodes with variable thickness degraderIBM·Filed 2017·Granted Apr 21, 2020·0 cites·17 claims
- 1558US12387982B2Adaptive fill techniques for avoiding electromigrationIBM·Filed 2022·Granted Aug 12, 2025·0 cites·16 claims
- 1658US9021328B2Shared error protection for register banksIBM·Filed 2013·Granted Apr 28, 2015·2 cites·11 claims
- 1756US9395403B2Optimization of integrated circuit reliabilityIBM·Filed 2013·Granted Jul 19, 2016·0 cites·20 claims
- 1854US12393764B2Thermally coupled aware device placementIBM·Filed 2022·Granted Aug 19, 2025·0 cites·17 claims
- 1953US10634797B2Real time X-ray dosimeter using diodes with variable thickness degraderIBM·Filed 2017·Granted Apr 28, 2020·0 cites·16 claims
- 2043US2014201599A1Error protection for integrated circuits in an insensitive directionIBM·Filed 2013·Application pending·0 cites
- 2139US9201727B2Error protection for a data busIBM·Filed 2013·Granted Dec 1, 2015·0 cites·8 claims
- 2236US2012259575A1Integrated circuit chip incorporating a test circuit that allows for on-chip stress testing in order to model or monitor device performance degradationGRAAS CAROLE D·Filed 2011·Application pending·0 cites
- 2333US9006827B2Radiation hardened memory cell and design structuresMASSEY JOHN G·Filed 2011·Granted Apr 14, 2015·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →