Inventor · disambiguated record

James Wai

Also filed as: WAI JAMES KWOK-YUE

2 granted patents·24 citations·filing 2001–2003

54Inventor score

Technology areasG01R G06F

Files withHEWLETT PACKARD DEVELOPMENT CO2

Top patents by PatentIndex Score

2 records

0173US6876207B2System and method for testing devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Apr 5, 2005·24 cites·19 claims
0237US6584600B2Hierarchical metal one usage tool for child level leaf cellHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Jun 24, 2003·0 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →