Inventor · disambiguated record
Junzo Yamada
Also filed as: YAMADA JUNZO
29 granted patents·1 pending application·642 citations·filing 1982–2002
97Inventor score
Top patents by PatentIndex Score
30 records- 0194US5486774ACMOS logic circuits having low and high-threshold voltage transistorsNIPPON TELEGRAPH & TELEPHONE·Filed 1994·Granted Jan 23, 1996·136 cites·11 claims
- 0290US5400342ASemiconductor memory having test circuit and test method thereofNIPPON TELEGRAPH & TELEPHONE·Filed 1992·Granted Mar 21, 1995·87 cites·36 claims
- 0390US4771404AMemory device employing multilevel storage circuitsNIPPON TELEGRAPH & TELEPHONE·Filed 1985·Granted Sep 13, 1988·88 cites·13 claims
- 0486US4747080ASemiconductor memory having self correction functionNIPPON TELEGRAPH & TELEPHONE·Filed 1986·Granted May 24, 1988·89 cites·14 claims
- 0574US4694428ASemiconductor memoryNIPPON TELEGRAPH & TELEPHONE·Filed 1985·Granted Sep 15, 1987·31 cites·10 claims
- 0673US4460998ASemiconductor memory devicesNIPPON TELEGRAPH & TELEPHONE·Filed 1982·Granted Jul 17, 1984·43 cites·7 claims
- 0763US4456980ASemiconductor memory deviceNIPPON TELEGRAPH & TELEPHONE·Filed 1982·Granted Jun 26, 1984·28 cites·7 claims
- 0860US6166845AElectro-optic probeANDO ELECTRIC·Filed 1999·Granted Dec 26, 2000·22 cites·3 claims
- 0958US6297651B1Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system moduleANDO ELECTRIC·Filed 2000·Granted Oct 2, 2001·8 cites·3 claims
- 1055US6445198B1Electro-optic sampling probe and a method for adjusting the sameANDO ELECTRIC·Filed 2000·Granted Sep 3, 2002·7 cites·5 claims
- 1154US6337565B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jan 8, 2002·5 cites·8 claims
- 1253US6567760B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 20, 2003·17 cites·23 claims
- 1351US6410906B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jun 25, 2002·5 cites·4 claims
- 1448US6201235B1Electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted Mar 13, 2001·14 cites·20 claims
- 1547US6384590B1Light receiving circuit for use in electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 1999·Granted May 7, 2002·13 cites·3 claims
- 1646US6507014B2Electro-optic probeANDO ELECTRIC·Filed 2002·Granted Jan 14, 2003·3 cites·19 claims
- 1746US6288531B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Sep 11, 2001·3 cites·7 claims
- 1844US6347005B1Electro-optic sampling probeANDO ELECTRIC·Filed 2000·Granted Feb 12, 2002·3 cites·9 claims
- 1942US6407561B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Jun 18, 2002·2 cites·6 claims
- 2041US6403946B1Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical systemANDO ELECTRIC·Filed 2000·Granted Jun 11, 2002·1 cites·3 claims
- 2139US6232765B1Electro-optical oscilloscope with improved samplingANDO ELECTRIC·Filed 1999·Granted May 15, 2001·8 cites·10 claims
- 2235US6469528B2Electro-optic sampling probe and measuring method using the sameANDO ELECTRIC·Filed 1999·Granted Oct 22, 2002·5 cites·10 claims
- 2335US6369562B2Electro-optical probe for oscilloscope measuring signal waveformANDO ELECTRIC·Filed 1999·Granted Apr 9, 2002·5 cites·6 claims
- 2434US2002017913A1Electro-optic sampling probeFiled 2001·Application pending·0 cites
- 2533US6388454B1Electro-optic sampling proberANDO ELECTRIC·Filed 1999·Granted May 14, 2002·4 cites·1 claims
- 2633US6297650B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Oct 2, 2001·4 cites·12 claims
- 2732US6342783B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Jan 29, 2002·3 cites·9 claims
- 2831US6288529B1Timing generation circuit for an electro-optic oscilloscopeANDO ELECTRIC·Filed 1999·Granted Sep 11, 2001·4 cites·2 claims
- 2930US6348787B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Feb 19, 2002·2 cites·16 claims
- 3030US6087838ASignal processing circuit for electro-optic probeANDO ELECTRIC·Filed 1998·Granted Jul 11, 2000·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →