Inventor · disambiguated record
Katsushi Ohta
Also filed as: OHTA KATSUSHI
22 granted patents·6 pending applications·135 citations·filing 1998–2018
94Inventor score
Top patents by PatentIndex Score
28 records- 0190US7818556B2Storage apparatus, control method, and control device which can be reliably started up when power is turned on even after there is an error during firmware updateTOSHIBA STORAGE DEVICE CORP·Filed 2007·Granted Oct 19, 2010·30 cites·24 claims
- 0270US10684952B2Disk device and disk device control methodTOSHIBA KK·Filed 2018·Granted Jun 16, 2020·2 cites·16 claims
- 0361US6429669B1Temperature-insensitive electro-optic probeANDO ELECTRIC·Filed 2000·Granted Aug 6, 2002·10 cites·24 claims
- 0460US6166845AElectro-optic probeANDO ELECTRIC·Filed 1999·Granted Dec 26, 2000·22 cites·3 claims
- 0558US6297651B1Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system moduleANDO ELECTRIC·Filed 2000·Granted Oct 2, 2001·8 cites·3 claims
- 0655US6445198B1Electro-optic sampling probe and a method for adjusting the sameANDO ELECTRIC·Filed 2000·Granted Sep 3, 2002·7 cites·5 claims
- 0754US6337565B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jan 8, 2002·5 cites·8 claims
- 0854US2010125685A1Storage apparatus and output signal generation circuitFUJITSU LTD·Filed 2009·Application pending·0 cites
- 0951US6410906B1Electro-optic probeANDO ELECTRIC·Filed 2000·Granted Jun 25, 2002·5 cites·4 claims
- 1049US9053746B2Disk device and data recording methodTOSHIBA KK·Filed 2014·Granted Jun 9, 2015·0 cites·20 claims
- 1146US6507014B2Electro-optic probeANDO ELECTRIC·Filed 2002·Granted Jan 14, 2003·3 cites·19 claims
- 1246US6288531B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Sep 11, 2001·3 cites·7 claims
- 1346US5943349AVariable wavelength laser deviceANDO ELECTRIC·Filed 1998·Granted Aug 24, 1999·12 cites·6 claims
- 1442US6407561B1Probe for electro-optic sampling oscilloscopeANDO ELECTRIC·Filed 2000·Granted Jun 18, 2002·2 cites·6 claims
- 1542US2008126784A1Storage apparatus, control method, and control deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1641US6403946B1Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical systemANDO ELECTRIC·Filed 2000·Granted Jun 11, 2002·1 cites·3 claims
- 1740US2006224842A1Information processor and program preparation methodFUJITSU LTD·Filed 2005·Application pending·0 cites
- 1836US6560003B2Light receiving module and light receiving method with reduced polarization dependenceANDO ELECTRIC·Filed 2001·Granted May 6, 2003·0 cites·6 claims
- 1935US6469528B2Electro-optic sampling probe and measuring method using the sameANDO ELECTRIC·Filed 1999·Granted Oct 22, 2002·5 cites·10 claims
- 2035US6369562B2Electro-optical probe for oscilloscope measuring signal waveformANDO ELECTRIC·Filed 1999·Granted Apr 9, 2002·5 cites·6 claims
- 2134US2001022340A1Electro-optic probeFiled 2000·Application pending·0 cites
- 2234US2002017913A1Electro-optic sampling probeFiled 2001·Application pending·0 cites
- 2333US6388454B1Electro-optic sampling proberANDO ELECTRIC·Filed 1999·Granted May 14, 2002·4 cites·1 claims
- 2433US6297650B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Oct 2, 2001·4 cites·12 claims
- 2532US6342783B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Jan 29, 2002·3 cites·9 claims
- 2632US2016170891A1Disk apparatus and control methodTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2730US6348787B1Electrooptic probeANDO ELECTRIC·Filed 1999·Granted Feb 19, 2002·2 cites·16 claims
- 2830US5936982AVariable wavelength laser light sourceANDO ELECTRIC·Filed 1998·Granted Aug 10, 1999·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →