Inventor · disambiguated record
Tsukasa Shishika
Also filed as: SHISHIKA TSUKASA
12 granted patents·5 pending applications·63 citations·filing 2003–2022
88Inventor score
Top patents by PatentIndex Score
17 records- 0187US7186973B2Ion trap/time-of-flight mass analyzing apparatus and mass analyzing methodHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 6, 2007·11 cites·10 claims
- 0287US7064319B2Mass spectrometerAPPLERA CORP·Filed 2003·Granted Jun 20, 2006·27 cites·11 claims
- 0384US7476850B2Method and its apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 13, 2009·9 cites·21 claims
- 0474US7928365B2Method and apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 19, 2011·3 cites·6 claims
- 0574US7755035B2Ion trap time-of-flight mass spectrometerHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·3 cites·4 claims
- 0673US8274044B2Mass spectroscope and mass spectrometryYOSHIOKA SHINJI·Filed 2009·Granted Sep 25, 2012·3 cites·8 claims
- 0772US8030611B2Mass spectrometer, method of mass spectrometry and program for mass spectrometryHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 4, 2011·3 cites·16 claims
- 0867US7999222B2Time-of-flight mass spectrometerHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·1 cites·7 claims
- 0965US9105453B2Mass spectrometer and mass spectrometryHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 11, 2015·1 cites·17 claims
- 1063US8633841B2Signal processing device, mass spectrometer, and photometerOONISHI FUJIO·Filed 2010·Granted Jan 21, 2014·2 cites·10 claims
- 1153US7890074B2Data acquisition systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 15, 2011·0 cites·10 claims
- 1250US2022412848A1Sample-analyzing apparatusHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1347US2025104994A1Mass spectrometer and control method thereofHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1445US11776800B2Substance analyzer and substance analysis methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 3, 2023·0 cites·12 claims
- 1543US2011192970A1Method and apparatus for mass spectrometryOONISHI FUJIO·Filed 2011·Application pending·0 cites
- 1642US2019317061A1Column and exchange deviceHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
- 1738US2018174811A1Mass spectrometry deviceHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →