Inventor · disambiguated record
Sridhar Tirumala
Also filed as: TIRUMALA SRIDHAR
9 granted patents·2 pending applications·41 citations·filing 2009–2017
85Inventor score
Top patents by PatentIndex Score
11 records- 0186US8359558B2Modeling of cell delay change for electronic design automationSYNOPSYS INC·Filed 2010·Granted Jan 22, 2013·10 cites·26 claims
- 0284US8271931B2Integrated circuit optimization modeling technologyCHEN QIANG·Filed 2010·Granted Sep 18, 2012·8 cites·20 claims
- 0382US8543958B2Optical proximity correction aware integrated circuit design optimizationCHEN QIANG·Filed 2009·Granted Sep 24, 2013·12 cites·26 claims
- 0473US8281275B2Reducing leakage power in integrated circuit designsTIRUMALA SRIDHAR·Filed 2011·Granted Oct 2, 2012·4 cites·18 claims
- 0570US8533649B2Reducing leakage power in integrated circuit designsTIRUMALA SRIDHAR·Filed 2012·Granted Sep 10, 2013·3 cites·14 claims
- 0664US9704296B2Image morphing processing using confidence levels based on captured imagesTRUPIK INC·Filed 2014·Granted Jul 11, 2017·3 cites·14 claims
- 0763US8555233B2Integrated circuit optimization modeling technologyCHEN QIANG·Filed 2012·Granted Oct 8, 2013·1 cites·22 claims
- 0852US8977993B2Modeling of cell delay change for electronic design automationSYNOPSYS INC·Filed 2012·Granted Mar 10, 2015·0 cites·21 claims
- 0943US2017309076A1Image morphing processing using confidence levels based on captured imagesTRUPIK INC·Filed 2017·Application pending·0 cites
- 1040US2017358134A1Systems and methods for image generation and modeling of complex three-dimensional objectsTRUPIK INC·Filed 2017·Application pending·0 cites
- 1138US9734631B2Systems and methods for image generation and modeling of complex three-dimensional objectsTRUPIK INC·Filed 2015·Granted Aug 15, 2017·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Sridhar Tirumala files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →