Inventor · disambiguated record
Meindert Martin Lunenborg
Also filed as: LUNENBORG MEINDERT · LUNENBORG MEINDERT M · LUNENBORG MEINDERT MARTIN
7 granted patents·20 citations·filing 2001–2018
80Inventor score
Files withPDF SOLUTIONS INC2KONINKL PHILIPS ELECTRONICS NV1KORDIC SRDJAN1PDF SOLUTIONS1PHILIPS CORP1
Top patents by PatentIndex Score
7 records- 0178US9691669B1Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologiesPDF SOLUTIONS·Filed 2015·Granted Jun 27, 2017·4 cites·10 claims
- 0253US10643735B1Passive array test structure for cross-point memory characterizationPDF SOLUTIONS INC·Filed 2018·Granted May 5, 2020·1 cites·13 claims
- 0352US8066430B2Semiconductor substrate temperature determinationKORDIC SRDJAN·Filed 2007·Granted Nov 29, 2011·4 cites·13 claims
- 0449US6518114B2Method of forming an insulating zonePHILIPS CORP·Filed 2001·Granted Feb 11, 2003·5 cites·6 claims
- 0548US10852337B2Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologiesPDF SOLUTIONS INC·Filed 2017·Granted Dec 1, 2020·0 cites·8 claims
- 0646US6746935B2MOS transistor in an integrated circuit and active area forming methodST MICROELECTRONICS SA·Filed 2001·Granted Jun 8, 2004·5 cites·3 claims
- 0741US6561839B2Process for forming shallow isolating regions in an integrated circuit and an integrated circuit thus formedKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted May 13, 2003·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →