Inventor · disambiguated record
Hiroshi Miyai
Also filed as: MIYAI HIROSHI
55 granted patents·11 pending applications·1,095 citations·filing 1992–2018
99Inventor score
Files withHITACHI LTD21HITACHI HIGH TECH CORP11MATSUSHITA ELECTRIC INDUSTRIAL CO LTD11PANASONIC CORP4HIROI TAKASHI3
Top patents by PatentIndex Score
66 records- 0196US6465781B1Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatusHITACHI LTD·Filed 2000·Granted Oct 15, 2002·85 cites·25 claims
- 0295US7607784B2Light emission method, light emitting apparatus and projection display apparatusPANASONIC CORP·Filed 2005·Granted Oct 27, 2009·26 cites·2 claims
- 0394US6952492B2Method and apparatus for inspecting a semiconductor deviceHITACHI LTD·Filed 2001·Granted Oct 4, 2005·50 cites·18 claims
- 0493US6583634B1Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·68 cites·5 claims
- 0592US8294752B2Image system, image display device and image viewing eyeglasses with themMIHARA KAZUHIRO·Filed 2009·Granted Oct 23, 2012·14 cites·15 claims
- 0692US7425704B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 16, 2008·14 cites·7 claims
- 0792US6865288B1Pattern inspection method and apparatusHITACHI LTD·Filed 2000·Granted Mar 8, 2005·75 cites·20 claims
- 0892US6628248B2Image display apparatus and method for compensating display image of image display apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 30, 2003·61 cites·27 claims
- 0991US8421010B2Charged particle beam device for scanning a sample using a charged particle beam to inspect the sampleHIROI TAKASHI·Filed 2009·Granted Apr 16, 2013·16 cites·10 claims
- 1091US7034298B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2003·Granted Apr 25, 2006·31 cites·14 claims
- 1190US6570611B1Image displayMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted May 27, 2003·52 cites·6 claims
- 1288US7116817B2Method and apparatus for inspecting a semiconductor deviceHITACHI LTD·Filed 2005·Granted Oct 3, 2006·10 cites·18 claims
- 1388US6703850B2Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Mar 9, 2004·37 cites·6 claims
- 1488US6511184B2Color image display apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jan 28, 2003·39 cites·24 claims
- 1586US7133550B2Pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Nov 7, 2006·19 cites·15 claims
- 1686US6898305B2Circuit pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted May 24, 2005·40 cites·24 claims
- 1785US7116816B2Method of inspecting a pattern and an apparatus thereof and a method of processing a specimenHITACHI LTD·Filed 2001·Granted Oct 3, 2006·41 cites·23 claims
- 1884US6943752B2Presentation system, a display device, and a programMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 13, 2005·27 cites·21 claims
- 1983US7957579B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Jun 7, 2011·5 cites·11 claims
- 2083US7894658B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Feb 22, 2011·4 cites·17 claims
- 2182US8643707B2Image signal processing apparatus, image signal processing method, recording medium, and integrated circuitMATSUMOTO KEIZO·Filed 2010·Granted Feb 4, 2014·4 cites·10 claims
- 2280US8036447B2Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 11, 2011·10 cites·3 claims
- 2380US7995833B2Method of alignment for efficient defect reviewHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 9, 2011·6 cites·2 claims
- 2480US7266235B2Pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Sep 4, 2007·10 cites·13 claims
- 2579US7269280B2Method and its apparatus for inspecting a patternHITACHI LTD·Filed 2002·Granted Sep 11, 2007·22 cites·26 claims
- 2679US7071468B2Circuit pattern inspection method and its apparatusHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 4, 2006·16 cites·6 claims
- 2778US7518383B2Inspection apparatus and inspection method using electron beamHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 14, 2009·4 cites·4 claims
- 2878US5933473ANon-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1997·Granted Aug 3, 1999·39 cites·16 claims
- 2977US8421008B2Pattern check device and pattern check methodNOZOE MARI·Filed 2009·Granted Apr 16, 2013·7 cites·16 claims
- 3077US7999565B2Inspection apparatus and inspection method using electron beamHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·3 cites·6 claims
- 3177US6771419B1Rear projection type image display unitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Aug 3, 2004·16 cites·9 claims
- 3275US8542246B2Color conversion device, color conversion table and color conversion methodSAIGO KATSUO·Filed 2009·Granted Sep 24, 2013·7 cites·6 claims
- 3375US7294833B2Method of alignment for efficient defect reviewHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 13, 2007·15 cites·5 claims
- 3475US6975754B2Circuit pattern inspection method and apparatusHITACHI LTD·Filed 2001·Granted Dec 13, 2005·19 cites·42 claims
- 3574US7457453B2Pattern inspection method and apparatusHITACHI LTD·Filed 2007·Granted Nov 25, 2008·4 cites·4 claims
- 3674US6613593B2Method of fabricating a semiconductor deviceHITACHI LTD·Filed 2001·Granted Sep 2, 2003·8 cites·18 claims
- 3773US5838396AProjection type image display apparatus with circuit for correcting luminance nonuniformityMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Nov 17, 1998·50 cites·10 claims
- 3872US8086022B2Electron beam inspection system and an image generation method for an electron beam inspection systemMIYAI HIROSHI·Filed 2008·Granted Dec 27, 2011·4 cites·8 claims
- 3971US8599107B2Image system, display device and eyeglasses device used in the sameMIHARA KAZUHIRO·Filed 2009·Granted Dec 3, 2013·3 cites·8 claims
- 4070US8086021B2Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscopeOMINAMI YUSUKE·Filed 2009·Granted Dec 27, 2011·2 cites·17 claims
- 4170US7872219B2Illumination device with plural color light sources and first and second integratorsPANASONIC CORP·Filed 2007·Granted Jan 18, 2011·3 cites·20 claims
- 4268US7855363B2Inspection method and apparatus using an electron beamHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 21, 2010·1 cites·11 claims
- 4367US8564648B2Image signal processing apparatus, image signal processing method, recording medium, and integrated circuitMATSUMOTO KEIZO·Filed 2010·Granted Oct 22, 2013·1 cites·1 claims
- 4466US5349460ARemote control system for controlling a television receiverMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Sep 20, 1994·35 cites·11 claims
- 4565US6333962B1Non-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1999·Granted Dec 25, 2001·21 cites·4 claims
- 4663US7847805B2Display apparatus, display method, program and recording mediumPANASONIC CORP·Filed 2004·Granted Dec 7, 2010·7 cites·21 claims
- 4760US5640462AImaging method of X-ray computerized tomography and apparatus for X-ray computerized tomographyHITACHI LTD·Filed 1992·Granted Jun 17, 1997·23 cites·14 claims
- 4853US10192653B2Twisted string-shaped electric cable for underwater purposePANASONIC IP MAN CO LTD·Filed 2018·Granted Jan 29, 2019·0 cites·13 claims
- 4953US6049586ANon-destructive inspection apparatus and inspection system using itHITACHI LTD·Filed 1999·Granted Apr 11, 2000·13 cites·6 claims
- 5050US9894549B2Information processing apparatus, radio communication system, and terminal position estimation methodNEC CORP·Filed 2014·Granted Feb 13, 2018·0 cites·20 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →