Inventor · disambiguated record
Keiichi Saiki
Also filed as: SAIKI KEIICHI
4 granted patents·1 pending application·149 citations·filing 2000–2023
79Inventor score
Technology areasH10P
Top patents by PatentIndex Score
5 records- 0193US6583634B1Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·68 cites·5 claims
- 0288US6703850B2Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Mar 9, 2004·37 cites·6 claims
- 0388US6597448B1Apparatus and method of inspecting foreign particle or defect on a sampleHITACHI LTD·Filed 2000·Granted Jul 22, 2003·44 cites·20 claims
- 0459US12362212B2Computer-readable recording medium, substrate bonding system, and substrate bonding methodTOKYO ELECTRON LTD·Filed 2023·Granted Jul 15, 2025·0 cites·9 claims
- 0553US2024006207A1Bonding apparatus and bonding methodTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Keiichi Saiki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →