Inventor · disambiguated record
Atsuko Yamaguchi
Also filed as: YAMAGUCHI ATSUKO
35 granted patents·1 pending application·824 citations·filing 1990–2025
98Inventor score
Top patents by PatentIndex Score
36 records- 0197US9824938B2Charged particle beam device and inspection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 21, 2017·20 cites·15 claims
- 0297US6446065B1Document retrieval assisting method and system for the same and document retrieval service using the sameHITACHI LTD·Filed 2000·Granted Sep 3, 2002·155 cites·12 claims
- 0397USD329862SCombined instant camera and printerKING JIM CO LTD·Filed 1990·Granted Sep 29, 1992·103 cites·1 claims
- 0496US7366620B2Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabricationHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 29, 2008·30 cites·15 claims
- 0593US7230723B2High-accuracy pattern shape evaluating method and apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 12, 2007·20 cites·7 claims
- 0691US7049589B2Pattern inspection methodHITACHI HIGH TECH CORP·Filed 2004·Granted May 23, 2006·63 cites·8 claims
- 0790US7369703B2Method and apparatus for circuit pattern inspectionHITACHI LTD·Filed 2006·Granted May 6, 2008·10 cites·22 claims
- 0889US8401273B2Apparatus for evaluating degradation of pattern featuresMOMONOI YOSHINORI·Filed 2010·Granted Mar 19, 2013·20 cites·13 claims
- 0988US9421955B2Suspension structure for irregular ground traveling vehicleHONDA MOTOR CO LTD·Filed 2015·Granted Aug 23, 2016·4 cites·8 claims
- 1088US8300919B2Apparatus for data analysisYAMAGUCHI ATSUKO·Filed 2009·Granted Oct 30, 2012·22 cites·12 claims
- 1188US7619751B2High-accuracy pattern shape evaluating method and apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 17, 2009·9 cites·20 claims
- 1288US6457004B1Document retrieval assisting method, system and service using closely displayed areas for titles and topicsHITACHI LTD·Filed 1998·Granted Sep 24, 2002·84 cites·13 claims
- 1387US6644756B1Wheel structureHONDA MOTOR CO LTD·Filed 2002·Granted Nov 11, 2003·29 cites·18 claims
- 1486US7095884B2Method and apparatus for circuit pattern inspectionHITACHI LTD·Filed 2002·Granted Aug 22, 2006·22 cites·6 claims
- 1582USD347241STape cartridge for tape writing machineKING JIM CO LTD·Filed 1992·Granted May 24, 1994·24 cites·1 claims
- 1681US7405835B2High-accuracy pattern shape evaluating method and apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 29, 2008·5 cites·18 claims
- 1779US7451857B2Seat mount structure for saddle ride type vehicleHONDA MOTOR CO LTD·Filed 2005·Granted Nov 18, 2008·10 cites·13 claims
- 1878US9658063B2Method and device for line pattern shape evaluationHITACHI HIGH TECH CORP·Filed 2014·Granted May 23, 2017·3 cites·18 claims
- 1977US6654738B2Computer program embodied on a computer-readable medium for a document retrieval service that retrieves documents with a retrieval service agent computerHITACHI LTD·Filed 2001·Granted Nov 25, 2003·27 cites·1 claims
- 2076US6745183B2Document retrieval assisting method and system for the same and document retrieval service using the sameHITACHI LTD·Filed 2002·Granted Jun 1, 2004·24 cites·2 claims
- 2176US5727168AI/O card, cable connected to the I/O card, and method for saving power of I/O cardFUJITSU LTD·Filed 1995·Granted Mar 10, 1998·44 cites·8 claims
- 2274US10724856B2Image analysis apparatus and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 28, 2020·2 cites·6 claims
- 2374USD344753SLabel printerKING JIM CO LTD·Filed 1992·Granted Mar 1, 1994·17 cites·1 claims
- 2473USD331018SCombined clock, timer and schedule managerKUNG JUN CO LTD·Filed 1990·Granted Nov 17, 1992·19 cites·1 claims
- 2571USD344752SLabel printerKING JIM CO LTD·Filed 1992·Granted Mar 1, 1994·15 cites·1 claims
- 2665US7290838B2Vehicle wheelHONDA MOTOR CO LTD·Filed 2003·Granted Nov 6, 2007·12 cites·5 claims
- 2764US8369602B2Length measurement systemHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 5, 2013·3 cites·6 claims
- 2863US10672119B2Inspection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 2, 2020·1 cites·10 claims
- 2962US2025336318A1Control system and control methodJVCKENWOOD CORP·Filed 2025·Application pending·0 cites
- 3060US9123504B2Semiconductor inspection device and semiconductor inspection method using the sameYAMAGUCHI ATSUKO·Filed 2010·Granted Sep 1, 2015·1 cites·3 claims
- 3151US6125041ACard-type electronic deviceFUJITSU LTD·Filed 1997·Granted Sep 26, 2000·15 cites·10 claims
- 3247US7684937B2Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabricationHITACHI HIGH TECH CORP·Filed 2008·Granted Mar 23, 2010·0 cites·9 claims
- 3346US9000366B2Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patternsHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 7, 2015·0 cites·10 claims
- 3445US9183622B2Image processing apparatusTOYODA YASUTAKA·Filed 2011·Granted Nov 10, 2015·0 cites·25 claims
- 3545USD338672SSpeaker for a combined clock, timer, and schedule managerKING JIM CO LTD·Filed 1990·Granted Aug 24, 1993·5 cites·1 claims
- 3634US6182785B1Dust cover structure for a power transmission memberHONDA MOTOR CO LTD·Filed 1998·Granted Feb 6, 2001·6 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →