Inventor · disambiguated record
Yoshihisa Abe
Also filed as: ABE YOSHIHISA
39 granted patents·10 pending applications·236 citations·filing 1990–2020
97Inventor score
Files withCOORSTEK KK10KONICA MINOLTA SENSING INC8COVALENT MATERIALS CORP5KONICA MINOLTA INC5TOSHIBA CERAMICS CO4
Top patents by PatentIndex Score
49 records- 0192US8212288B2Compound semiconductor substrate comprising a multilayer buffer layerKOMIYAMA JUN·Filed 2010·Granted Jul 3, 2012·15 cites·32 claims
- 0292US7812969B2Three-dimensional shape measuring apparatusKONICA MINOLTA SENSING INC·Filed 2007·Granted Oct 12, 2010·33 cites·13 claims
- 0392US7724380B2Method and system for three-dimensional measurementKONICA MINOLTA SENSING INC·Filed 2006·Granted May 25, 2010·32 cites·9 claims
- 0489US11201217B2Nitride semiconductor substrateCOORSTEK KK·Filed 2020·Granted Dec 14, 2021·2 cites·1 claims
- 0585US6798527B2Three-dimensional shape-measuring systemMINOLTA CO LTD·Filed 2002·Granted Sep 28, 2004·44 cites·12 claims
- 0684US7715020B2Three-dimensional shape measuring systemKONICA MINOLTA SENSING INC·Filed 2007·Granted May 11, 2010·15 cites·21 claims
- 0782US8216667B2Tantalum carbide-coated carbon material and production method thereofFUJIWARA HIROKAZU·Filed 2006·Granted Jul 10, 2012·5 cites·20 claims
- 0882US7368757B2Compound semiconductor and compound semiconductor device using the sameCOVALENT MATERIALS CORP·Filed 2005·Granted May 6, 2008·8 cites·5 claims
- 0980US10522386B2Susceptor and method for manufacturing sameTOYO TANSO CO·Filed 2015·Granted Dec 31, 2019·3 cites·11 claims
- 1076US10068858B2Compound semiconductor substrateCOORSTEK KK·Filed 2016·Granted Sep 4, 2018·2 cites·6 claims
- 1176US8986466B2Method for carburizing tantalum member, and tantalum memberABE YOSHIHISA·Filed 2010·Granted Mar 24, 2015·2 cites·7 claims
- 1275US7684613B2Method and system for aligning three-dimensional shape data from photogrammetry data and three-dimensional measurement data using target locations and surface vectorsKONICA MINOLTA SENSING INC·Filed 2006·Granted Mar 23, 2010·9 cites·7 claims
- 1373US8148753B2Compound semiconductor substrate having multiple buffer layersOISHI HIROSHI·Filed 2010·Granted Apr 3, 2012·3 cites·3 claims
- 1472US7436525B2Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting methodKONICA MINOLTA SENSING INC·Filed 2007·Granted Oct 14, 2008·9 cites·10 claims
- 1566US9748344B2Nitride semiconductor substrate having recesses at interface between base substrate and initial nitrideCOORSTEK KK·Filed 2016·Granted Aug 29, 2017·1 cites·2 claims
- 1665US6958753B2Method and apparatus for reducing three-dimensional shape dataMINOLTA CO LTD·Filed 2000·Granted Oct 25, 2005·11 cites·22 claims
- 1764US8785942B2Nitride semiconductor substrate and method of manufacturing the sameYOSHIDA AKIRA·Filed 2012·Granted Jul 22, 2014·1 cites·8 claims
- 1864US5012984AProcess for production of coal-water mixtureCENTRAL RES INST ELECT·Filed 1990·Granted May 7, 1991·20 cites·3 claims
- 1962US7262485B2Substrate for growing electro-optical single crystal thin film and method of manufacturing the sameCOVALENT MATERIALS CORP·Filed 2005·Granted Aug 28, 2007·1 cites·7 claims
- 2061US8637960B2Nitride semiconductor substrateCOVALENT MATERIALS CORP·Filed 2012·Granted Jan 28, 2014·1 cites·2 claims
- 2161US8121814B2Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processorABE YOSHIHISA·Filed 2009·Granted Feb 21, 2012·4 cites·11 claims
- 2261US7592298B2Composition for oil-based liquid cleansingFANCL CORP·Filed 2005·Granted Sep 22, 2009·0 cites·12 claims
- 2360US6778172B2Method and apparatus for extracting surface from three-dimensional shape data as well as recording mediumMINOLTA CO LTD·Filed 2001·Granted Aug 17, 2004·8 cites·14 claims
- 2459US7495776B2Three-dimensional measuring systemKONICA MINOLTA SENSING INC·Filed 2005·Granted Feb 24, 2009·3 cites·29 claims
- 2557US11605716B2Nitride semiconductor substrate and method of manufacturing the sameCOORSTEK KK·Filed 2020·Granted Mar 14, 2023·0 cites·1 claims
- 2655US7643159B2Three-dimensional shape measuring system, and three-dimensional shape measuring methodKONICA MINOLTA SENSING INC·Filed 2007·Granted Jan 5, 2010·2 cites·4 claims
- 2754US2007116663A1Composition containing polyglycerol/medium-chain fatty acid esterIWANAGA TETSURO·Filed 2004·Application pending·0 cites
- 2851US10559679B2Nitride semiconductor epitaxial substrateCOORSTEK KK·Filed 2018·Granted Feb 11, 2020·0 cites·2 claims
- 2948US10593790B2Nitride semiconductor substrate and method for manufacturing the sameCOORSTEK KK·Filed 2018·Granted Mar 17, 2020·0 cites·4 claims
- 3048US2009065812A1Compound semiconductor substrateCOVALENT MATERIALS CORP·Filed 2008·Application pending·0 cites
- 3147US11089225B2Optical measuring device, image generating method, and image generating programKONICA MINOLTA INC·Filed 2017·Granted Aug 10, 2021·0 cites·20 claims
- 3247US10825895B2Nitride semiconductor substrateCOORSTEK KK·Filed 2019·Granted Nov 3, 2020·0 cites·1 claims
- 3347US2008224268A1Nitride semiconductor single crystal substrateCOVALENT MATERIALS CORP·Filed 2008·Application pending·0 cites
- 3446US6936490B2Semiconductor wafer and its manufacturing methodTOSHIBA CERAMICS CO·Filed 2002·Granted Aug 30, 2005·2 cites·24 claims
- 3545US2007210304A1Nitride semiconductor single crystal filmTOSHIBA CERAMICS CO·Filed 2007·Application pending·0 cites
- 3644US2016131526A1Spectroscopic Analysis System and MethodKONICA MINOLTA INC·Filed 2014·Application pending·0 cites
- 3743US9435018B2Method for carburizing tantalum containerWATANABE MASANARI·Filed 2011·Granted Sep 6, 2016·0 cites·7 claims
- 3843US2020194580A1Nitride semiconductor substrate and nitride semiconductor deviceCOORSTEK KK·Filed 2019·Application pending·0 cites
- 3942US9885668B2Surface inspection device, surface inspection method, and programKONICA MINOLTA INC·Filed 2015·Granted Feb 6, 2018·0 cites·20 claims
- 4042US9536955B2Nitride semiconductor substrateCOVALENT MAT CORP·Filed 2014·Granted Jan 3, 2017·0 cites·2 claims
- 4140US9976905B2Surface characteristic measurement deviceKONICA MINOLTA INC·Filed 2015·Granted May 22, 2018·0 cites·20 claims
- 4240US8538137B2Image processing apparatus, information processing system, and image processing methodSUMITOMO HIRONORI·Filed 2010·Granted Sep 17, 2013·0 cites·13 claims
- 4340US7764386B2Method and system for three-dimensional measurement and method and device for controlling manipulatorKONICA MINOLTA SENSING INC·Filed 2006·Granted Jul 27, 2010·0 cites·8 claims
- 4440US2005263754A1Substrates for growth of chemical compound semiconductors, chemical compound semiconductors using the substrates and processes for producing thereofTOSHIBA CERAMICS CO·Filed 2004·Application pending·0 cites
- 4540US2007069216A1Substrate for compound semiconductor device and compound semiconductor device using the sameTOSHIBA CERAMICS CO·Filed 2006·Application pending·0 cites
- 4638US9530846B2Nitride semiconductor substrateCOORSTEK KK·Filed 2016·Granted Dec 27, 2016·0 cites·6 claims
- 4736US2003058455A1Three-dimensional shape measuring apparatusFiled 2002·Application pending·0 cites
- 4835US2018151714A1Nitride semiconductor substrateCOORSTEK KK·Filed 2017·Application pending·0 cites
- 4933US11280677B2Colorimeter capable of taking a fixed posture with respect to a measurement objectKONICA MINOLTA INC·Filed 2017·Granted Mar 22, 2022·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →