Inventor · disambiguated record
Timothy E. Cooper
Also filed as: COOPER TIMOTHY E
10 granted patents·1 pending application·257 citations·filing 2002–2009
90Inventor score
Files withFORMFACTOR INC11
Top patents by PatentIndex Score
11 records- 0194US7218127B2Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral componentFORMFACTOR INC·Filed 2004·Granted May 15, 2007·63 cites·3 claims
- 0293US7202682B2Composite motion probingFORMFACTOR INC·Filed 2002·Granted Apr 10, 2007·55 cites·23 claims
- 0393US7071715B2Probe card configuration for low mechanical flexural strength electrical routing substratesFORMFACTOR INC·Filed 2004·Granted Jul 4, 2006·73 cites·12 claims
- 0492US7482822B2Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2006·Granted Jan 27, 2009·16 cites·6 claims
- 0587US7084650B2Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2002·Granted Aug 1, 2006·30 cites·54 claims
- 0686US7463043B2Methods of probing an electronic deviceFORMFACTOR INC·Filed 2007·Granted Dec 9, 2008·9 cites·30 claims
- 0782US7825674B2Probe card configuration for low mechanical flexural strength electrical routing substratesFORMFACTOR INC·Filed 2006·Granted Nov 2, 2010·7 cites·38 claims
- 0858US7701243B2Electronic device testing using a probe tip having multiple contact featuresFORMFACTOR INC·Filed 2008·Granted Apr 20, 2010·0 cites·16 claims
- 0957US2009134897A1Apparatus and method for limiting over travel in a probe card assemblyFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 1052US7694246B2Test method for yielding a known good dieFORMFACTOR INC·Filed 2002·Granted Apr 6, 2010·4 cites·16 claims
- 1145US7868632B2Composite motion probingFORMFACTOR INC·Filed 2007·Granted Jan 11, 2011·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →