Inventor · disambiguated record
Dug-Young Kim
Also filed as: KIM DUG-YOUNG
11 granted patents·52 citations·filing 2001–2017
87Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4KIM DUG YOUNG3KWANGJU INST SCI & TECH2YONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF2
Top patents by PatentIndex Score
11 records- 0173US6813959B2Apparatus and method for measuring residual stress and photoelastic effect of optical fiberSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 9, 2004·14 cites·2 claims
- 0273US6647162B2Apparatus and method for measuring residual stress and photoelastic effect of optical fiberSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 11, 2003·15 cites·9 claims
- 0370US7679038B2Optical phase microscope using rotating 1/4 wavelength plate with pinhole in the center position and Fourier transformed lensKWANGJU INST SCI & TECH·Filed 2009·Granted Mar 16, 2010·5 cites·7 claims
- 0469US8314405B2Apparatus for measuring fluorescence lifetimeKIM DUG YOUNG·Filed 2008·Granted Nov 20, 2012·4 cites·17 claims
- 0560US8064064B2Apparatus and method for obtaining images using coherent anti-stokes Raman scatteringKIM DUG YOUNG·Filed 2009·Granted Nov 22, 2011·1 cites·16 claims
- 0654US6678433B2Apparatus and method for measuring residual stress and photoelastic effect of optical fiberSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 13, 2004·7 cites·25 claims
- 0751US7369249B2Apparatus for measuring differential mode delay of multimode optical fiberKWANGJU INST SCI & TECH·Filed 2006·Granted May 6, 2008·2 cites·18 claims
- 0849US6373564B1Image tracking device and method for transverse measurement of optical fiberSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 16, 2002·4 cites·5 claims
- 0937US11280736B2Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method thereforYONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF·Filed 2017·Granted Mar 22, 2022·0 cites·6 claims
- 1037US8098371B2Apparatus for measuring residual stress of optical fiberKIM DUG YOUNG·Filed 2009·Granted Jan 17, 2012·0 cites·4 claims
- 1133US10845311B2Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error through virtual fluorescence distribution model from signal collected in analog mean delay methodYONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF·Filed 2017·Granted Nov 24, 2020·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →