Inventor · disambiguated record
Naoya Tamaki
Also filed as: TAMAKI NAOYA
14 granted patents·1 pending application·252 citations·filing 1997–2013
93Inventor score
Top patents by PatentIndex Score
15 records- 0187US5784285AWaveform analyzerNEC CORP·Filed 1997·Granted Jul 21, 1998·67 cites·6 claims
- 0284US6661318B2Radio frequency circuit module on multi-layer substrateNEC CORP·Filed 2001·Granted Dec 9, 2003·25 cites·5 claims
- 0380US6396264B1Triplate striplines used in a high-frequency circuit and a shielded-loop magnetic field detectorNEC CORP·Filed 2000·Granted May 28, 2002·26 cites·21 claims
- 0476US6842093B2Radio frequency circuit module on multi-layer substrateNEC CORP·Filed 2003·Granted Jan 11, 2005·15 cites·7 claims
- 0573US6281697B1Semiconductor device evaluation apparatusNEC CORP·Filed 1999·Granted Aug 28, 2001·34 cites·14 claims
- 0670US6661243B2Semiconductor device evaluation apparatus and semiconductor device evaluation program productNEC CORP·Filed 2001·Granted Dec 9, 2003·13 cites·5 claims
- 0767US6847276B2Radio frequency circuit module on multi-layer substrateNEC CORP·Filed 2003·Granted Jan 25, 2005·9 cites·8 claims
- 0859US6144196AMagnetic field measuring apparatus and apparatus for measuring spatial resolution of magnetic field detectorNEC CORP·Filed 1998·Granted Nov 7, 2000·21 cites·9 claims
- 0957US6300779B1Semiconductor device evaluation apparatus and semiconductor device evaluation program productNEC CORP·Filed 1999·Granted Oct 9, 2001·17 cites·13 claims
- 1054US6882542B2Electronic apparatusNEC CORP·Filed 2003·Granted Apr 19, 2005·6 cites·10 claims
- 1151US6750648B1Magnetic field detector having a dielectric looped faceNEC CORP·Filed 2000·Granted Jun 15, 2004·5 cites·166 claims
- 1244US7504837B2Electrical characteristics measurement method and electrical characteristics measurement deviceNEC CORP·Filed 2004·Granted Mar 17, 2009·2 cites·7 claims
- 1342US2013234304A1Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1441US6320376B1Magnetic field sensor and system for measuring a magnetic field including a plurality of conductors electrically connected in a loopNEC CORP·Filed 1999·Granted Nov 20, 2001·9 cites·9 claims
- 1531US6163150AMagnetic field sensorNEC CORP·Filed 1999·Granted Dec 19, 2000·3 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →