Inventor · disambiguated record
Jing Shu
Also filed as: SHU JING · SHU JING S · SHU JING-SHING
13 granted patents·206 citations·filing 1980–2022
91Inventor score
Top patents by PatentIndex Score
13 records- 0181US4318976AHigh gel rigidity, negative electron beam resistsTEXAS INSTRUMENTS INC·Filed 1980·Granted Mar 9, 1982·37 cites·8 claims
- 0280US11119568B2Suspend mode feature for artificial reality systemsFACEBOOK TECH LLC·Filed 2020·Granted Sep 14, 2021·2 cites·20 claims
- 0378US11416067B2Suspend mode feature for artificial reality systemsFACEBOOK TECH LLC·Filed 2021·Granted Aug 16, 2022·1 cites·20 claims
- 0478US5705232AIn-situ coat, bake and cure of dielectric material processing system for semiconductor manufacturingTEXAS INSTRUMENTS INC·Filed 1994·Granted Jan 6, 1998·70 cites·14 claims
- 0575US5972769ASelf-aligned multiple crown storage capacitor and method of formationTEXAS INSTR INCOPORATED·Filed 1997·Granted Oct 26, 1999·32 cites·10 claims
- 0660US5972803AHigh throughput optical curing process for semiconductor device manufacturingTEXAS INSTRUMENTS INC·Filed 1997·Granted Oct 26, 1999·24 cites·15 claims
- 0757US6151103AMethod and system for improved optical imaging in microlithographyTEXAS INSTRUMENTS INC·Filed 1999·Granted Nov 21, 2000·15 cites·17 claims
- 0854US11788562B1Artificial muscle for robotic systemsUNIV HONG KONG CHINESE·Filed 2022·Granted Oct 17, 2023·0 cites·17 claims
- 0954US4657844APlasma developable negative resist compositions for electron beam, X-ray and optical lithographyTEXAS INSTRUMENTS INC·Filed 1985·Granted Apr 14, 1987·13 cites·1 claims
- 1044US5780852ADimension measurement of a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 14, 1998·10 cites·20 claims
- 1137US6417091B2Mask and method for forming dynamic random access memory (DRAM) contactsTEXAS INSTRUMENTS INC·Filed 2001·Granted Jul 9, 2002·0 cites·3 claims
- 1227US6194306B1Mask and method for forming dynamic random access memory (DRAM) contactsTEXAS INSTRUMENTS INC·Filed 1998·Granted Feb 27, 2001·0 cites·10 claims
- 1318US5378498AAntistatic solution for microlithic measurementTEXAS INSTRUMENTS INC·Filed 1994·Granted Jan 3, 1995·2 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →