Inventor · disambiguated record
Masanari Kajiwara
Also filed as: KAJIWARA MASANARI
2 granted patents·3 pending applications·1 citations·filing 2010–2018
30Inventor score
Top patents by PatentIndex Score
5 records- 0158US8443310B2Pattern correcting method, mask forming method, and method of manufacturing semiconductor deviceKAJIWARA MASANARI·Filed 2011·Granted May 14, 2013·1 cites·20 claims
- 0241US2015234268A1Mask pattern correction method and non-transitory computer-readable recording medium containing a mask pattern correction programTOSHIBA KK·Filed 2014·Application pending·0 cites
- 0333US10606165B2Mask pattern verification methodTOSHIBA MEMORY CORP·Filed 2018·Granted Mar 31, 2020·0 cites·16 claims
- 0430US2012198396A1Method of optimizing semiconductor device manufacturing process, method of manufacturing semiconductor device, and non-transitory computer readable mediumKAJIWARA MASANARI·Filed 2011·Application pending·0 cites
- 0528US2011224934A1Evaluating apparatus, evaluating method, and computer program productMIYOSHI SEIRO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →