Inventor · disambiguated record
Karl Wisspeintner
Also filed as: WISSPEINTNER KARL
12 granted patents·1 pending application·403 citations·filing 1990–2014
92Inventor score
Files withMICRO EPSILON MESSTECHNIK6BUEHLER AG1HEIDELBERGER DRUCKMASCH AG1MICRO EPSILON MESSTECHNIK GMBH & CO KG1MICROEPSILON MESSTECHNIK GMBH1
Top patents by PatentIndex Score
13 records- 0197US5485082AMethod of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the likeMICRO EPSILON MESSTECHNIK·Filed 1990·Granted Jan 16, 1996·195 cites·12 claims
- 0289US7369225B2Device and method for inspecting surfaces in the interior of holesMICRO EPSILON MESSTECHNIK·Filed 2006·Granted May 6, 2008·23 cites·19 claims
- 0387US6462536B1Eddy current sensorMICRO EPSILON MESSTECHNIK·Filed 1998·Granted Oct 8, 2002·66 cites·21 claims
- 0480US6288536B1Eddy current sensorMICROEPSILON MESSTECHNIK GMBH·Filed 1997·Granted Sep 11, 2001·55 cites·17 claims
- 0557US10060762B2Inductive sensor comprising integrated soft magnetic layer and method for the production thereofMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2014·Granted Aug 28, 2018·1 cites·22 claims
- 0651US8554503B2Method for calibrating a thickness gaugeSCHALLMOSER GUENTER·Filed 2009·Granted Oct 8, 2013·3 cites·15 claims
- 0747US5606509ACorrection of a measuring signal obtained from a pair of scanning rollers and pertaining to the thickness of a textile fiber sliverRIETER INGOLSTADT SPINNEREI·Filed 1996·Granted Feb 25, 1997·14 cites·9 claims
- 0846US7092833B2Method and circuit for linearizing nonlinear curvesMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Aug 15, 2006·4 cites·39 claims
- 0945US6999892B2Circuit arrangement and method for controlling and evaluating signal detectorsMICRO EPSILON MESSTECHNIK·Filed 2002·Granted Feb 14, 2006·2 cites·27 claims
- 1040US5601743AApparatus for determining the solid contents of a slug by induction heatingBUEHLER AG·Filed 1995·Granted Feb 11, 1997·9 cites·21 claims
- 1135US7358982B2Imaging device for a printing pressHEIDELBERGER DRUCKMASCH AG·Filed 2004·Granted Apr 15, 2008·0 cites·24 claims
- 1235US6318153B1Non-contact film thickness gauging sensorMICRO EPSILON MESSTECHNIK·Filed 1996·Granted Nov 20, 2001·31 cites·13 claims
- 1335US2010244860A1Capacitive anti-pinch means and method for operating an anti-pinch meansWISSPEINTNER KARL·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →