Inventor · disambiguated record
Satoshi Haraichi
Also filed as: HARAICHI SATOSHI
20 granted patents·1,224 citations·filing 1985–2011
97Inventor score
Top patents by PatentIndex Score
20 records- 0197US5055696AMultilayered device micro etching method and systemHITACHI LTD·Filed 1989·Granted Oct 8, 1991·207 cites·19 claims
- 0294US4868068AIC wiring connecting method and resulting articleHITACHI LTD·Filed 1987·Granted Sep 19, 1989·59 cites·43 claims
- 0393US4900695ASemiconductor integrated circuit device and process for producing the sameHITACHI LTD·Filed 1987·Granted Feb 13, 1990·151 cites·31 claims
- 0491US5683547AProcessing method and apparatus using focused energy beamHITACHI LTD·Filed 1994·Granted Nov 4, 1997·156 cites·5 claims
- 0590US5358806APhase shift mask, method of correcting the same and apparatus for carrying out the methodHITACHI LTD·Filed 1992·Granted Oct 25, 1994·70 cites·25 claims
- 0690US4683378AApparatus for ion beam workHITACHI LTD·Filed 1985·Granted Jul 28, 1987·46 cites·8 claims
- 0787US6753253B1Method of making wiring and logic corrections on a semiconductor device by use of focused ion beamsHITACHI LTD·Filed 1990·Granted Jun 22, 2004·97 cites·19 claims
- 0887US5223109AIon beam processing method and apparatusHITACHI LTD·Filed 1991·Granted Jun 29, 1993·52 cites·5 claims
- 0986US5086015AMethod of etching a semiconductor device by an ion beamHITACHI LTD·Filed 1989·Granted Feb 4, 1992·75 cites·10 claims
- 1086US4933565AMethod and apparatus for correcting defects of X-ray maskHITACHI LTD·Filed 1988·Granted Jun 12, 1990·43 cites·11 claims
- 1185US4925755AMethod of correcting defect in circuit patternHITACHI LTD·Filed 1988·Granted May 15, 1990·40 cites·6 claims
- 1284US5342448AApparatus for processing a sample using a charged beam and reactive gasesHITACHI LTD·Filed 1993·Granted Aug 30, 1994·39 cites·14 claims
- 1380US5447614AMethod of processing a sample using a charged beam and reactive gases and system employing the sameHITACHI LTD·Filed 1994·Granted Sep 5, 1995·31 cites·8 claims
- 1477US5229607ACombination apparatus having a scanning electron microscope thereinHITACHI LTD·Filed 1991·Granted Jul 20, 1993·47 cites·29 claims
- 1572US5439763AOptical mask and method of correcting the sameHITACHI LTD·Filed 1993·Granted Aug 8, 1995·24 cites·24 claims
- 1670US5497034AIC wiring connecting method and apparatusHITACHI LTD·Filed 1994·Granted Mar 5, 1996·22 cites·72 claims
- 1768US9209054B2Device manufacturing apparatusHARA SHIRO·Filed 2011·Granted Dec 8, 2015·2 cites·7 claims
- 1868US5472507AIC wiring connecting method and apparatusHITACHI LTD·Filed 1994·Granted Dec 5, 1995·19 cites·44 claims
- 1968US5026664AMethod of providing a semiconductor IC device with an additional conduction pathHITACHI LTD·Filed 1989·Granted Jun 25, 1991·35 cites·26 claims
- 2051US5824598AIC wiring connecting method using focused energy beamsHITACHI LTD·Filed 1995·Granted Oct 20, 1998·9 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →