Inventor · disambiguated record
Yoshiro Nakata
Also filed as: NAKATA YOSHIRO
27 granted patents·2 pending applications·741 citations·filing 1982–2015
97Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD23NIHON MICRONICS KK3PANASONIC CORP2AGENCY IND SCIENCE TECHN1
Top patents by PatentIndex Score
29 records- 0195US6215321B1Probe card for wafer-level measurement, multilayer ceramic wiring board, and fabricating methods thereforMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Apr 10, 2001·129 cites·4 claims
- 0288US6229329B1Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneouslyMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted May 8, 2001·56 cites·3 claims
- 0384US5399890ASemiconductor memory device in which a capacitor electrode of a memory cell and an interconnection layer of a peripheral circuit are formed in one levelMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Mar 21, 1995·50 cites·8 claims
- 0480US5006717AMethod of evaluating a semiconductor device and an apparatus for performing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1989·Granted Apr 9, 1991·48 cites·18 claims
- 0576US5605844AInspecting method for semiconductor devicesMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Feb 25, 1997·51 cites·18 claims
- 0675US5248936ASemiconductor integrated circuit and a method of testing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Sep 28, 1993·31 cites·2 claims
- 0774US5214296AThin-film semiconductor device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted May 25, 1993·37 cites·8 claims
- 0873US6297658B1Wafer burn-in cassette and method of manufacturing probe card for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Oct 2, 2001·35 cites·8 claims
- 0973US5217914AMethod for making semiconductor integration circuit with stacked capacitor cellsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Jun 8, 1993·36 cites·11 claims
- 1072US10101365B2Semiconductor module, electrical connector, and inspection apparatusNIHON MICRONICS KK·Filed 2015·Granted Oct 16, 2018·2 cites·10 claims
- 1172US5355081AMethod for testing a semiconductor integrated circuit having self testing circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Oct 11, 1994·27 cites·4 claims
- 1271US5241201ADram with concentric adjacent capacitorsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Aug 31, 1993·30 cites·4 claims
- 1370US5825193ASemiconductor integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Oct 20, 1998·32 cites·4 claims
- 1466US6784681B2Semiconductor integrated circuit testing system and methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Aug 31, 2004·11 cites·14 claims
- 1564US5829126AMethod of manufacturing probe cardMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Nov 3, 1998·30 cites·7 claims
- 1662US6400175B2Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jun 4, 2002·7 cites·1 claims
- 1762US5300814ASemiconductor device having a semiconductor substrate with reduced step between memory cellsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Apr 5, 1994·30 cites·3 claims
- 1858US5983331ASemiconductor integrated circuit having a plurality of chipsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Nov 9, 1999·32 cites·12 claims
- 1957US6781400B2Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 24, 2004·5 cites·1 claims
- 2057US6518779B1Probe cardMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Feb 11, 2003·20 cites·7 claims
- 2149US9442160B2Probe assembly and probe base plateNIHON MICRONICS KK·Filed 2014·Granted Sep 13, 2016·0 cites·11 claims
- 2249US5892368ASemiconductor integrated circuit device having failure detection circuitryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Apr 6, 1999·12 cites·1 claims
- 2348US5315543ASemiconductor memory device and a manufacturing method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted May 24, 1994·13 cites·5 claims
- 2446US2009289653A1Inspection apparatus and method for semiconductor ICPANASONIC CORP·Filed 2009·Application pending·0 cites
- 2545US5665610ASemiconductor device checking methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Sep 9, 1997·12 cites·10 claims
- 2644US9638746B2Probe card and inspection deviceNIHON MICRONICS KK·Filed 2013·Granted May 2, 2017·0 cites·21 claims
- 2744US7589546B2Inspection apparatus and method for semiconductor ICPANASONIC CORP·Filed 2007·Granted Sep 15, 2009·0 cites·5 claims
- 2838US4614586ASemipermeable polymeric film membraneAGENCY IND SCIENCE TECHN·Filed 1982·Granted Sep 30, 1986·5 cites·7 claims
- 2938US2002190743A1Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →