Inventor · disambiguated record
Young-Chang Joo
Also filed as: JOO YOUNG CHANG
19 granted patents·4 pending applications·804 citations·filing 1998–2025
94Inventor score
Files withADVANCED MICRO DEVICES INC9SEOUL NAT UNIV R&DB FOUNDATION6SAMSUNG ELECTRONICS CO LTD2FOUNDATION SEOUL TECHNOPARK1GWANGJU INST SCIENCE & TECH1
Top patents by PatentIndex Score
23 records- 0198US6242349B1Method of forming copper/copper alloy interconnection with reduced electromigrationADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 5, 2001·439 cites·16 claims
- 0290US6124203AMethod for forming conformal barrier layersADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 26, 2000·107 cites·20 claims
- 0384US6633083B2Barrier layer integrity testADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 14, 2003·33 cites·20 claims
- 0484US6339958B1Adhesion strength testing using a depth-sensing indentation techniqueADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 22, 2002·68 cites·7 claims
- 0582US6053034AMethod for measuring fracture toughness of thin filmsADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 25, 2000·58 cites·34 claims
- 0674US11525189B2Method of manufacturing MoS2 having 1T crystal structureSEOUL NAT UNIV R&DB FOUNDATION·Filed 2019·Granted Dec 13, 2022·0 cites·14 claims
- 0772US6121141AMethod of forming a void free copper interconnectsADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 19, 2000·39 cites·19 claims
- 0866US6821901B2Method of through-etching substrateSONG SEUNG JIN·Filed 2002·Granted Nov 23, 2004·16 cites·19 claims
- 0964US6228768B1Storage-annealing plated CU interconnectsADVANCED MICRO DEVICES INC·Filed 1998·Granted May 8, 2001·28 cites·8 claims
- 1062US7929330B2Multi-bit memory device using multi-plugSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Apr 19, 2011·2 cites·20 claims
- 1162US2025338397A1Transparent-freeform wiring with auxetic structure and method for manufacturing the sameGWANGJU INST SCIENCE & TECH·Filed 2025·Application pending·0 cites
- 1261US8216635B2Method of forming metal wiring and metal wiring formed using the sameSONG YOUNG AH·Filed 2009·Granted Jul 10, 2012·3 cites·9 claims
- 1357US2023243051A1Catalyst structure for electrochemical co2 reduction, and method for producing sameSEOUL NAT UNIV R&DB FOUNDATION·Filed 2019·Application pending·0 cites
- 1456US11008673B2Chalcogenide-carbon nanofiber and preparation method thereforSEOUL NAT UNIV R&DB FOUNDATION·Filed 2016·Granted May 18, 2021·0 cites·12 claims
- 1552US11850805B2Method for manufacturing PDMS device and PDMS device manufactured therebySEOUL NAT UNIV R&DB FOUNDATION·Filed 2021·Granted Dec 26, 2023·0 cites·7 claims
- 1651US9510445B2Member for flexible element and manufacturing method thereofSNU R&DB FOUNDATION·Filed 2012·Granted Nov 29, 2016·0 cites·15 claims
- 1746US11474069B2Open-junction ionic transistorSEOUL NAT UNIV R&DB FOUNDATION·Filed 2020·Granted Oct 18, 2022·0 cites·20 claims
- 1846US10682698B2Metal-carbon nanofiber and production method thereofSEOUL NAT UNIV R&DB FOUNDATION·Filed 2015·Granted Jun 16, 2020·0 cites·14 claims
- 1943US8410373B2Printed circuit substrate and method of manufacturing the samePARK HYUNG WOOK·Filed 2010·Granted Apr 2, 2013·0 cites·7 claims
- 2043US6348701B1Method for determining metal concentration in a field areaADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 19, 2002·9 cites·4 claims
- 2142US2009243787A1Electrical fuse devices and methods of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 2235US2013037946A1Semiconductor chip including bump having barrier layer, and manufacturing method thereofFOUNDATION SEOUL TECHNOPARK·Filed 2011·Application pending·0 cites
- 2328US6242924B1Method for electronically measuring size of internal void in electrically conductive leadADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 5, 2001·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →