Inventor · disambiguated record
Kazuo Chinone
Also filed as: CHINONE KAZUO
14 granted patents·2 pending applications·148 citations·filing 1992–2018
91Inventor score
Top patents by PatentIndex Score
16 records- 0179US10908104B2Radiation analysis apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Feb 2, 2021·2 cites·7 claims
- 0275US5854492ASuperconducting quantum interference device fluxmeter and nondestructive inspection apparatusSEIKO INSTR INC·Filed 1996·Granted Dec 29, 1998·49 cites·16 claims
- 0368US6974952B2Radiation detectorSII NANOTECHNOLOGY INC·Filed 2003·Granted Dec 13, 2005·13 cites·20 claims
- 0461US5825183ARadial differential squid magnetic flux meterSEIKO INSTR INC·Filed 1996·Granted Oct 20, 1998·23 cites·13 claims
- 0553US5306521AProcess for manufacturing DC superconducting quantum interference deviceSEIKO INSTR INC·Filed 1992·Granted Apr 26, 1994·15 cites·13 claims
- 0652US6025713ASuperconducting quantum interference device and non-destructive evaluation apparatus using the sameSEIKO INSTR INC·Filed 1998·Granted Feb 15, 2000·16 cites·32 claims
- 0752US5834938ANondestructive inspection apparatus with superconducting magnetic sensorSEIKO INSTR INC·Filed 1996·Granted Nov 10, 1998·16 cites·20 claims
- 0849US10048216B2X-ray analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Aug 14, 2018·0 cites·9 claims
- 0949US10018578B2X-ray analysis deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Jul 10, 2018·0 cites·6 claims
- 1048US10801977B2Radiation analyzing apparatus and radiation analyzing methodHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Oct 13, 2020·0 cites·4 claims
- 1146US6111405ANondestructive method of quantitatively evaluating degree of plasticity of steel materialSEIKO INSTR INC·Filed 1998·Granted Aug 29, 2000·11 cites·9 claims
- 1245US2018275079A1Radiation Analyzing ApparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Application pending·0 cites
- 1343US2017269012A1X-ray analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2017·Application pending·0 cites
- 1442US10151773B2Scanning probe microscope and probe contact detection methodHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Dec 11, 2018·0 cites·4 claims
- 1532US5825182ANondestructive testing system using a SQUIDSEIKO INSTR INC·Filed 1994·Granted Oct 20, 1998·3 cites·16 claims
- 1630US5982172AMethod of detecting plastic deformation in steel using a differential type magnetic field sensorSEIKO INSTR INC·Filed 1996·Granted Nov 9, 1999·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →