Inventor · disambiguated record
Churoo Park
Also filed as: PARK CHUROO
14 granted patents·749 citations·filing 1993–1998
95Inventor score
Technology areasG11C
Top patents by PatentIndex Score
14 records- 0194US5631871ASystem for selecting one of a plurality of memory banks for use in an active cycle and all other banks for an inactive precharge cycleSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted May 20, 1997·84 cites·1 claims
- 0294US5590086ASemiconductor memory having a plurality of I/O busesSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 31, 1996·92 cites·1 claims
- 0393US5835956ASynchronous dram having a plurality of latency modesSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 10, 1998·76 cites·33 claims
- 0492US5838990ACircuit in a semiconductor memory for programming operation modes of the memorySAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 17, 1998·63 cites·47 claims
- 0592US5568445ASynchronous semiconductor memory device with a write latency control functionSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Oct 22, 1996·101 cites·17 claims
- 0689US5933379AMethod and circuit for testing a semiconductor memory device operating at high frequencySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Aug 3, 1999·79 cites·8 claims
- 0788US5703828ASemiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 30, 1997·52 cites·14 claims
- 0888US5621691AColumn redundancy circuit and method of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Apr 15, 1997·74 cites·15 claims
- 0986US6343036B1Multi-bank dynamic random access memory devices having all bank precharge capabilitySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 29, 2002·41 cites·15 claims
- 1086US5384735AData output buffer of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1993·Granted Jan 24, 1995·60 cites·8 claims
- 1145US5835446AColumn decoder for semiconductor memory device with prefetch schemeSAMSUN ELECTRONIC CO LTD·Filed 1996·Granted Nov 10, 1998·12 cites·11 claims
- 1245US5579280ASemiconductor memory device and method for gating the columns thereofSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Nov 26, 1996·12 cites·11 claims
- 1333US5822270ACircuit for generating internal column address suitable for burst modeSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Oct 13, 1998·3 cites·4 claims
- 1429US5748639AMulti-bit test circuits for integrated circuit memory devices and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted May 5, 1998·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →