Inventor · disambiguated record
Harry Dietrich
Also filed as: DIETRICH HARRY · DIETRICH HARRY B
12 granted patents·213 citations·filing 1980–2002
92Inventor score
Top patents by PatentIndex Score
12 records- 0181US5821149AMethod of fabricating a heterobipolar transistorDAIMLER BENZ AG·Filed 1997·Granted Oct 13, 1998·65 cites·10 claims
- 0275US5424227AMethod of manufacture of silicon-germanium heterobipolar transistorsTELEFUNKEN MICROELECTRON·Filed 1994·Granted Jun 13, 1995·41 cites·10 claims
- 0361US4924285AMonolithic multichannel detector amplifier arrays and circuit channelsUS NAVY·Filed 1988·Granted May 8, 1990·20 cites·20 claims
- 0459US6716721B2Method for manufacturing a silicon waferATMEL GERMANY GMBH·Filed 2002·Granted Apr 6, 2004·10 cites·20 claims
- 0554US6720238B2Method for manufacturing buried areasATMEL GERMANY GMBH·Filed 2002·Granted Apr 13, 2004·7 cites·23 claims
- 0654US5587327AProcess for preparing a heterojunction bipolar transistorDAIMLER BENZ AG·Filed 1995·Granted Dec 24, 1996·23 cites·13 claims
- 0749US5637883AOptically addressed spatial light modulator using an intrinsic semiconductor active material and high resistivity cladding layersUS ARMY·Filed 1995·Granted Jun 10, 1997·17 cites·20 claims
- 0849US4267014ASemiconductor encapsulant for annealing ion-implanted GaAsUS NAVY·Filed 1980·Granted May 12, 1981·15 cites·11 claims
- 0945US6764923B2Method for manufacturing components of an SOI waferATMEL GERMANY GMBH·Filed 2002·Granted Jul 20, 2004·3 cites·41 claims
- 1034US6335562B1Method and design for the suppression of single event upset failures in digital circuits made from GaAs and related compoundsUS NAVY·Filed 1999·Granted Jan 1, 2002·4 cites·6 claims
- 1131US4673446AMethod of forming thermally stable high resistivity regions in n-type indium phosphide by oxygen implantationUS NAVY·Filed 1985·Granted Jun 16, 1987·4 cites·11 claims
- 1224US5294557AImplanting impurities in semiconductors and semiconductor implanted with impuritiesUS ARMY·Filed 1991·Granted Mar 15, 1994·4 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →