Inventor · disambiguated record
Masayuki Nara
Also filed as: NARA MASAYUKI
18 granted patents·1 pending application·35 citations·filing 2004–2022
90Inventor score
Top patents by PatentIndex Score
19 records- 0177US11867809B2Measurement apparatus and measurement methodMITUTOYO CORP·Filed 2020·Granted Jan 9, 2024·1 cites·10 claims
- 0272US10557941B2Method and apparatus for inspecting positioning machine by laser tracking interferometerMITUTOYO CORP·Filed 2017·Granted Feb 11, 2020·2 cites·14 claims
- 0372US8175743B2Measurement system and interferometerNARA MASAYUKI·Filed 2010·Granted May 8, 2012·6 cites·8 claims
- 0470US9335186B2Index error estimating apparatus, index error calibrating apparatus, and index error estimating methodNARA MASAYUKI·Filed 2012·Granted May 10, 2016·2 cites·3 claims
- 0570US7225104B2Method and program for estimating uncertaintyMITUTOYO CORP·Filed 2006·Granted May 29, 2007·7 cites·8 claims
- 0669US7765079B2Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording mediumMITUTOYO CORP·Filed 2008·Granted Jul 27, 2010·6 cites·11 claims
- 0768US12241737B2Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatusesMITUTOYO CORP·Filed 2022·Granted Mar 4, 2025·0 cites·13 claims
- 0862US9316487B2Laser tracking interferometerMITUTOYO CORP·Filed 2014·Granted Apr 19, 2016·2 cites·19 claims
- 0962US8514405B2Tracking type laser gauge interferometer with rotation mechanism correctionNARA MASAYUKI·Filed 2010·Granted Aug 20, 2013·3 cites·5 claims
- 1062US7583374B2Measurement method and measurement apparatus using tracking type laser interferometerMITUTOYO CORP·Filed 2008·Granted Sep 1, 2009·4 cites·9 claims
- 1154US11359910B2Inspection method, correction method, and inspection deviceMITUTOYO CORP·Filed 2020·Granted Jun 14, 2022·0 cites·17 claims
- 1252US11525664B2Calibration methodMITUTOYO CORP·Filed 2021·Granted Dec 13, 2022·0 cites·10 claims
- 1351US11656074B2Calibration methodMITUTOYO CORP·Filed 2022·Granted May 23, 2023·0 cites·8 claims
- 1447US7188046B2Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the programMITUTOYO CORP·Filed 2004·Granted Mar 6, 2007·2 cites·9 claims
- 1546US7483807B2Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the programMITUTOYO CORP·Filed 2007·Granted Jan 27, 2009·0 cites·6 claims
- 1645US11366448B2Spatial accuracy correction method and apparatusMITUTOYO CORP·Filed 2018·Granted Jun 21, 2022·0 cites·2 claims
- 1745US11366447B2Spatial accuracy correction method and apparatusMITUTOYO CORP·Filed 2018·Granted Jun 21, 2022·0 cites·15 claims
- 1843US11530908B2Measurement point determination method, non-transitory storage medium, and measurement point determination apparatusMITUTOYO CORP·Filed 2019·Granted Dec 20, 2022·0 cites·8 claims
- 1937US2008287467A1Therapeutic Agent for Respiratory DiseasesTAMURA GEN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →