Inventor · disambiguated record
Shi-Yuan Tong
Also filed as: TONG SHI-YUAN
8 granted patents·4 pending applications·3 citations·filing 2005–2024
74Inventor score
Files withIND TECH RES INST12
Top patents by PatentIndex Score
12 records- 0174US10890611B2Electrostatic measuring system for inner wall of fluid pipeline and measuring method thereofIND TECH RES INST·Filed 2018·Granted Jan 12, 2021·1 cites·9 claims
- 0270US10684312B2Current detection device and methodIND TECH RES INST·Filed 2017·Granted Jun 16, 2020·1 cites·12 claims
- 0369US11747301B2Magnetic field structureIND TECH RES INST·Filed 2021·Granted Sep 5, 2023·0 cites·11 claims
- 0462US2025218634A1Electronic device, magnetic connection mechanism, and magnetic assembly thereofIND TECH RES INST·Filed 2023·Application pending·0 cites
- 0560US11573277B2Electromagnetic property measuring device, electromagnetic property measuring system and electromagnetic property measuring methodIND TECH RES INST·Filed 2020·Granted Feb 7, 2023·0 cites·20 claims
- 0658US2023225096A1Electromagnetic wave absorbing material, preparing method thereof and composite structure for suppressing electromagnetic interferenceIND TECH RES INST·Filed 2022·Application pending·0 cites
- 0753US10901022B2Electrostatic detecting deviceIND TECH RES INST·Filed 2018·Granted Jan 26, 2021·0 cites·8 claims
- 0853US2024251536A1Electromagnetic wave absorberIND TECH RES INST·Filed 2023·Application pending·0 cites
- 0953US2025220866A1Electromagnetic loss film and electromagnetic loss composite structure using the sameIND TECH RES INST·Filed 2024·Application pending·0 cites
- 1047US11913981B2Electrostatic sensing system and electrostatic sensing assemblyIND TECH RES INST·Filed 2020·Granted Feb 27, 2024·0 cites·15 claims
- 1144US10656193B2Electrostatic detecting system and methodIND TECH RES INST·Filed 2016·Granted May 19, 2020·0 cites·16 claims
- 1239US7342823B2Tunneling magnetoresistance device with high magnetoimpedance (MI) effectIND TECH RES INST·Filed 2005·Granted Mar 11, 2008·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →