Inventor · disambiguated record
Pei-Yuan Gao
Also filed as: GAO PEI-YUAN
17 granted patents·1 pending application·226 citations·filing 1998–2008
93Inventor score
Top patents by PatentIndex Score
18 records- 0191US6764949B2Method for reducing pattern deformation and photoresist poisoning in semiconductor device fabricationADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 20, 2004·53 cites·18 claims
- 0291US6653735B1CVD silicon carbide layer as a BARC and hard mask for gate patterningADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 25, 2003·57 cites·3 claims
- 0380US6803313B2Method for forming a hardmask employing multiple independently formed layers of a pecvd material to reduce pinholesADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 12, 2004·19 cites·11 claims
- 0479US7033960B1Multi-chamber deposition of silicon oxynitride film for patterningADVANCED MICRO DEVICES INC·Filed 2004·Granted Apr 25, 2006·22 cites·13 claims
- 0571US7300886B1Interlayer dielectric for charge loss improvementSPANSION LLC·Filed 2005·Granted Nov 27, 2007·3 cites·20 claims
- 0670US7060554B2PECVD silicon-rich oxide layer for reduced UV chargingADVANCED MICRO DEVICES INC·Filed 2003·Granted Jun 13, 2006·12 cites·7 claims
- 0769US6803265B1Liner for semiconductor memories and manufacturing method thereforFASL LLC·Filed 2002·Granted Oct 12, 2004·15 cites·20 claims
- 0867US7297592B1Semiconductor memory with data retention linerSPANSION LLC·Filed 2005·Granted Nov 20, 2007·2 cites·20 claims
- 0963US6410461B1Method of depositing sion with reduced defectsADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 25, 2002·8 cites·10 claims
- 1060US6489253B1Method of forming a void-free interlayer dielectric (ILD0) for 0.18-μm flash memory technology and semiconductor device thereby formedADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 3, 2002·6 cites·10 claims
- 1151US6403385B1Method of inspecting a semiconductor wafer for defectsADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 11, 2002·18 cites·24 claims
- 1250US7023046B2Undoped oxide liner/BPSG for improved data retentionADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 4, 2006·3 cites·3 claims
- 1346US6369453B1Semiconductor wafer for measurement and recordation of impurities in semiconductor insulatorsADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 9, 2002·2 cites·4 claims
- 1445US7183198B2Method for forming a hardmask employing multiple independently formed layers of a capping material to reduce pinholesADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 27, 2007·0 cites·11 claims
- 1541US6627973B1Void-free interlayer dielectric (ILD0) for 0.18-micron flash memory semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 30, 2003·0 cites·15 claims
- 1641US2006214218A1Semiconductor device and method of fabricating the sameSHISHIDO KIYOKAZU·Filed 2005·Application pending·0 cites
- 1740US8202810B2Low-H plasma treatment with N2 anneal for electronic memory devicesNICKEL ALEXANDER H·Filed 2008·Granted Jun 19, 2012·0 cites·9 claims
- 1835US6297065B1Method to rework device with faulty metal stack layerADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 2, 2001·6 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →