Inventor · disambiguated record
Masafumi Kyogaku
Also filed as: KYOGAKU MASAFUMI
20 granted patents·11 pending applications·137 citations·filing 1995–2021
93Inventor score
Top patents by PatentIndex Score
31 records- 0197US11307509B2Electro-conductive member, method for producing same, process cartridge and electrophotographic image forming apparatusCANON KK·Filed 2020·Granted Apr 19, 2022·8 cites·8 claims
- 0295US11556073B2Electroconductive elastic body, electrophotographic member, process cartridge, and electrophotographic image-forming apparatusCANON KK·Filed 2021·Granted Jan 17, 2023·2 cites·12 claims
- 0392US7067336B1Electron-emitting device, electron source and image-forming apparatus, and manufacturing methods thereofCANON KK·Filed 2000·Granted Jun 27, 2006·38 cites·15 claims
- 0492US6900581B2Electron-emitting device, electron source and image-forming apparatus, and manufacturing methods thereofCANON KK·Filed 2004·Granted May 31, 2005·35 cites·15 claims
- 0588US8957370B1Ionization apparatus, mass spectrometer including ionization apparatus, and image forming systemCANON KK·Filed 2014·Granted Feb 17, 2015·8 cites·14 claims
- 0679US9252004B2Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging systemCANON KK·Filed 2014·Granted Feb 2, 2016·3 cites·20 claims
- 0777US6992428B2Electron emitting device, electron source and image display device and methods of manufacturing these devicesCANON KK·Filed 2002·Granted Jan 31, 2006·12 cites·49 claims
- 0874US9230787B2Ionization apparatus, mass spectrometer including ionization apparatus, and image forming systemCANON KK·Filed 2014·Granted Jan 5, 2016·2 cites·20 claims
- 0969US9134246B2Light source adjustment unit, optical measurement device, subject information obtaining system, and wavelength adjustment programCANON KK·Filed 2014·Granted Sep 15, 2015·1 cites·20 claims
- 1069US8637808B2Mass distribution measuring method and mass distribution measuring apparatusCANON KK·Filed 2012·Granted Jan 28, 2014·2 cites·11 claims
- 1164US7432883B2Driving method for electron-emitting device, driving method for electron source, manufacturing method for electron source, and image display apparatusCANON KK·Filed 2004·Granted Oct 7, 2008·13 cites·21 claims
- 1257US7138759B2Electron-emitting device, electron source, and image display apparatusCANON KK·Filed 2004·Granted Nov 21, 2006·3 cites·12 claims
- 1354US6817915B2Method of transforming polymer films into carbon filmsCANON KK·Filed 2003·Granted Nov 16, 2004·2 cites·6 claims
- 1453US10184885B2Information processing device to process spectral information, and information processing methodCANON KK·Filed 2014·Granted Jan 22, 2019·0 cites·21 claims
- 1552US8963078B2Ion group irradiation device and secondary ion mass spectrometerCANON KK·Filed 2014·Granted Feb 24, 2015·0 cites·17 claims
- 1651US2010066235A1Image display apparatusCANON KK·Filed 2009·Application pending·0 cites
- 1750US2015311055A1Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging systemCANON KK·Filed 2015·Application pending·0 cites
- 1849US9627177B2Mass spectrometer and mass image analyzing systemCANON KK·Filed 2013·Granted Apr 18, 2017·0 cites·19 claims
- 1949US9267902B2Method of analyzing sample using secondary ion emitted from sample and analyzer for performing analysis methodKOMATSU MANABU·Filed 2012·Granted Feb 23, 2016·0 cites·20 claims
- 2046US9312116B2Mass distribution spectrometry method and mass distribution spectrometerCANON KK·Filed 2012·Granted Apr 12, 2016·0 cites·17 claims
- 2146US2016123813A1Spectral microscopy deviceCANON KK·Filed 2014·Application pending·0 cites
- 2246US2015115148A1Mass distribution measurement method and mass distribution measurement apparatusCANON KK·Filed 2014·Application pending·0 cites
- 2346US2015115149A1Mass distribution measurement method and mass distribution measurement apparatusCANON KK·Filed 2014·Application pending·0 cites
- 2445US2014374586A1Ion group irradiation device, secondary ion mass spectrometer, and secondary ion mass spectrometry methodCANON KK·Filed 2014·Application pending·0 cites
- 2545US2014374585A1Ion group irradiation device, secondary ion mass spectrometer, and secondary ion mass spectrometry methodCANON KK·Filed 2014·Application pending·0 cites
- 2644US2016123812A1Spectral microscopy deviceCANON KK·Filed 2014·Application pending·0 cites
- 2740US5567872AScanning atomic force microscopeCANON KK·Filed 1995·Granted Oct 22, 1996·8 cites·6 claims
- 2836US2016203968A1Probe displacement measuring apparatus, ionization apparatus including the same, and mass spectrometry apparatusCANON KK·Filed 2016·Application pending·0 cites
- 2934US2016099139A1Mass microscope apparatusCANON KK·Filed 2015·Application pending·0 cites
- 3033US10690897B2Laser scanning microscope apparatusCANON KK·Filed 2016·Granted Jun 23, 2020·0 cites·10 claims
- 3133US2015311057A1Ion group irradiation device, secondary ion mass spectrometer, and secondary ion mass spectrometry methodCANON KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →