Inventor · disambiguated record
Hiroyuki Okahira
Also filed as: OKAHIRA HIROYUKI
4 granted patents·35 citations·filing 1998–2015
73Inventor score
Top patents by PatentIndex Score
4 records- 0170US6671041B2Apparatus for inspecting a substrateOLYMPUS OPTICAL CO·Filed 2001·Granted Dec 30, 2003·11 cites·23 claims
- 0258US6707546B2Apparatus for inspecting a substrateOLYMPUS OPTICAL CO·Filed 2001·Granted Mar 16, 2004·6 cites·9 claims
- 0351US6362884B1Apparatus for inspecting a substrateOLYMPUS OPTICAL CO·Filed 1998·Granted Mar 26, 2002·18 cites·13 claims
- 0440US9970922B2Observation apparatusOLYMPUS CORP·Filed 2015·Granted May 15, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →