Inventor · disambiguated record
Peter Fiekowsky
Also filed as: FIEKOWSKY PETER · FIEKOWSKY PETER J
25 granted patents·9 pending applications·5,205 citations·filing 1994–2008
98Inventor score
Files withAFFYMETRIX INC14CARDIAC MARINERS INC5FIEKOWSKY PETER J4AFFYMETRIX TECHNOLOGIES N V1FIEKOWSKY PETER1
Top patents by PatentIndex Score
34 records- 0198US6141096AMethod and apparatus for detection of fluorescently labeled materialsAFFYMETRIX INC·Filed 1997·Granted Oct 31, 2000·306 cites·15 claims
- 0298US6025601AMethod and apparatus for imaging a sample on a deviceAFFYMETRIX INC·Filed 1997·Granted Feb 15, 2000·451 cites·27 claims
- 0398US5834758AMethod and apparatus for imaging a sample on a deviceAFFYMETRIX INC·Filed 1996·Granted Nov 10, 1998·498 cites·7 claims
- 0498US5644612AImage reconstruction methodsCARDIAC MARINERS INC·Filed 1995·Granted Jul 1, 1997·166 cites·13 claims
- 0598US5631734AMethod and apparatus for detection of fluorescently labeled materialsAFFYMETRIX INC·Filed 1994·Granted May 20, 1997·989 cites·18 claims
- 0698US5578832AMethod and apparatus for imaging a sample on a deviceAFFYMETRIX INC·Filed 1994·Granted Nov 26, 1996·1.1k cites·22 claims
- 0797US6649914B1Scanning-beam X-ray imaging systemCARDIAC MARINERS INC·Filed 1999·Granted Nov 18, 2003·143 cites·14 claims
- 0897US5835561AScanning beam x-ray imaging systemCARDIAC MARINERS INC·Filed 1995·Granted Nov 10, 1998·155 cites·2 claims
- 0996US6741344B1Method and apparatus for detection of fluorescently labeled materialsAFFYMETRIX INC·Filed 2000·Granted May 25, 2004·81 cites·22 claims
- 1096US5751785AImage reconstruction methodsCARDIAC MARINERS INC·Filed 1996·Granted May 12, 1998·116 cites·19 claims
- 1196US5729584AScanning-beam X-ray imaging systemCARDIAC MARINERS INC·Filed 1996·Granted Mar 17, 1998·122 cites·23 claims
- 1295US6090555AScanned image alignment systems and methodsAFFYMETRIX INC·Filed 1997·Granted Jul 18, 2000·403 cites·21 claims
- 1392US6397165B1Microscopic corner radius measurement systemFIEKOWSKY PETER J·Filed 2001·Granted May 28, 2002·41 cites·10 claims
- 1492US6252236B1Method and apparatus for imaging a sample on a deviceAFFYMETRIX TECHNOLOGIES N V·Filed 1999·Granted Jun 26, 2001·107 cites·20 claims
- 1592US5764209AFlat panel display inspection systemPHOTON DYNAMICS INC·Filed 1995·Granted Jun 9, 1998·156 cites·20 claims
- 1691US6405153B1Microscopic feature opacity measurement systemFIEKOWSKY PETER J·Filed 2000·Granted Jun 11, 2002·36 cites·6 claims
- 1790US6539331B1Microscopic feature dimension measurement systemFiled 2000·Granted Mar 25, 2003·37 cites·14 claims
- 1888US7472372B1Fast image simulation for photolithographyFIEKOWSKY PETER J·Filed 2005·Granted Dec 30, 2008·10 cites·15 claims
- 1987US6611767B1Scanned image alignment systems and methodsAFFYMETRIX INC·Filed 2000·Granted Aug 26, 2003·64 cites·23 claims
- 2085US6760473B1Optical proximity correction serif measurement techniqueKLA TENCOR TECH CORP·Filed 2000·Granted Jul 6, 2004·25 cites·17 claims
- 2183US6765651B1Fast image simulation for photolithographyFiled 2003·Granted Jul 20, 2004·55 cites·26 claims
- 2282US5966677AHigh accuracy particle dimension measurement systemFiled 1997·Granted Oct 12, 1999·46 cites·24 claims
- 2375US6167355AHigh accuracy particle dimension measurement systemFIEKOWSKY PETER J·Filed 1999·Granted Dec 26, 2000·33 cites·51 claims
- 2472US6263292B1High accuracy particle dimension measurement systemFiled 1998·Granted Jul 17, 2001·27 cites·21 claims
- 2561US8233735B2Methods and apparatus for detection of fluorescently labeled materialsSTERN DAVID·Filed 2008·Granted Jul 31, 2012·0 cites·14 claims
- 2654US2005200948A1Method and apparatus for imaging a sample on a deviceAFFYMETRIX INC·Filed 2005·Application pending·0 cites
- 2754US2006111850A1Method and apparatus for detection of fluorescently labeled materialsAFFYMETRIX INC·Filed 2005·Application pending·0 cites
- 2853US2004196456A1Method and apparatus for detection of fluorescently labeled materialsAFFYMETRIX INC·Filed 2004·Application pending·0 cites
- 2952US2004048362A1Method and apparatus for imaging a sample on a deviceFiled 2003·Application pending·0 cites
- 3051US2003152490A1Method and apparatus for imaging a sample on a deviceFiled 2003·Application pending·0 cites
- 3144US2006258002A1Scanned image alignment systems and methodsAFFYMETRIX INC·Filed 2006·Application pending·0 cites
- 3243US2006165313A1Scanned image alignment systems and methodsAFFYMETRIX INC·Filed 2006·Application pending·0 cites
- 3342US2008002874A1Distinguishing reference image errors in optical inspectionsFIEKOWSKY PETER·Filed 2006·Application pending·0 cites
- 3439US2005037367A9Scanned image alignment systems and methodsAFFYMETRIX INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →