Inventor · disambiguated record
Heita Kimizuka
Also filed as: KIMIZUKA Heita
13 granted patents·2 pending applications·21 citations·filing 2018–2023
85Inventor score
Files withHITACHI HIGH TECH CORP15
Top patents by PatentIndex Score
15 records- 0198US11043359B2Charged particle beam apparatus and charged particle beam inspection systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 22, 2021·14 cites·10 claims
- 0296US11398367B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·4 cites·11 claims
- 0390US11398366B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 26, 2022·2 cites·14 claims
- 0488US11749494B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 5, 2023·1 cites·16 claims
- 0574US12450715B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2023·Granted Oct 21, 2025·0 cites·12 claims
- 0673US12394041B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2023·Granted Aug 19, 2025·0 cites·14 claims
- 0771US11646172B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted May 9, 2023·0 cites·14 claims
- 0864US11694325B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 4, 2023·0 cites·19 claims
- 0962US11776103B2System for deriving electrical characteristics and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 3, 2023·0 cites·18 claims
- 1055US12001521B2Adjusting method of charged particle beam device and charged particle beam device systemHITACHI HIGH TECH CORP·Filed 2019·Granted Jun 4, 2024·0 cites·20 claims
- 1154US11335535B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted May 17, 2022·0 cites·3 claims
- 1249US2024177964A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1349US2024151665A1Inspection systemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1443US12512294B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 30, 2025·0 cites·10 claims
- 1542US11232929B2Method for determining irradiation conditions for charged particle beam device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jan 25, 2022·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →