Inventor · disambiguated record
Robert W. Wells
Also filed as: WELLS ROBERT W
25 granted patents·1,088 citations·filing 1996–2014
97Inventor score
Files withXILINX INC25
Top patents by PatentIndex Score
25 records- 0193US6539508B1Methods and circuits for testing programmable logicXILINX INC·Filed 2000·Granted Mar 25, 2003·66 cites·32 claims
- 0292US6817006B1Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2002·Granted Nov 9, 2004·51 cites·25 claims
- 0391US6891395B2Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2004·Granted May 10, 2005·43 cites·16 claims
- 0491US6356514B1Built-in self test method for measuring clock to out delaysXILINX INC·Filed 2001·Granted Mar 12, 2002·40 cites·13 claims
- 0591US6219305B1Method and system for measuring signal propagation delays using ring oscillatorsXILINX INC·Filed 1998·Granted Apr 17, 2001·91 cites·32 claims
- 0691US6023565AMethod for configuring circuits over a data communications linkXILINX INC·Filed 1997·Granted Feb 8, 2000·156 cites·31 claims
- 0790US5673198AConcurrent electronic circuit design and implementationXILINX INC·Filed 1996·Granted Sep 30, 1997·172 cites·32 claims
- 0888US6233205B1Built-in self test method for measuring clock to out delaysXILINX INC·Filed 1998·Granted May 15, 2001·57 cites·13 claims
- 0986US6594610B1Fault emulation testing of programmable logic devicesXILINX INC·Filed 2001·Granted Jul 15, 2003·36 cites·24 claims
- 1085US6324672B1Method for configuring circuits over a data communications linkXILINX INC·Filed 2000·Granted Nov 27, 2001·37 cites·22 claims
- 1183US6466520B1Built-in AC self test using pulse generatorsXILINX INC·Filed 1999·Granted Oct 15, 2002·48 cites·16 claims
- 1283US6232845B1Circuit for measuring signal delays in synchronous memory elementsXILINX INC·Filed 1999·Granted May 15, 2001·49 cites·22 claims
- 1383US6075418ASystem with downstream set or clear for measuring signal propagation delays on integrated circuitsXILINX INC·Filed 1999·Granted Jun 13, 2000·49 cites·21 claims
- 1482US6611477B1Built-in self test using pulse generatorsXILINX INC·Filed 2002·Granted Aug 26, 2003·25 cites·17 claims
- 1580US7007250B1Application-specific methods useful for testing look up tables in programmable logic devicesXILINX INC·Filed 2003·Granted Feb 28, 2006·20 cites·19 claims
- 1680US6664808B2Method of using partially defective programmable logic devicesXILINX INC·Filed 2001·Granted Dec 16, 2003·26 cites·22 claims
- 1779US9012245B1Methods of making integrated circuit productsXILINX INC·Filed 2014·Granted Apr 21, 2015·5 cites·20 claims
- 1878US6651238B1Providing fault coverage of interconnect in an FPGAXILINX INC·Filed 2001·Granted Nov 18, 2003·23 cites·20 claims
- 1976US6069849AMethod and system for measuring signal propagation delays using the duty cycle of a ring oscillatorXILINX INC·Filed 1998·Granted May 30, 2000·37 cites·14 claims
- 2073US7127697B1Methods of utilizing programmable logic devices having localized defects in application-specific productsXILINX INC·Filed 2003·Granted Oct 24, 2006·15 cites·14 claims
- 2171US7725787B1Testing of a programmable deviceXILINX INC·Filed 2008·Granted May 25, 2010·5 cites·20 claims
- 2270US7219314B1Application-specific methods for testing molectronic or nanoscale devicesXILINX INC·Filed 2004·Granted May 15, 2007·14 cites·17 claims
- 2363US6920621B1Methods of testing for shorts in programmable logic devices using relative quiescent current measurementsXILINX INC·Filed 2003·Granted Jul 19, 2005·9 cites·25 claims
- 2461US6594797B1Methods and circuits for precise edge placement of test signalsXILINX INC·Filed 2000·Granted Jul 15, 2003·11 cites·20 claims
- 2547US7454675B1Testing of a programmable deviceXILINX INC·Filed 2004·Granted Nov 18, 2008·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →