Inventor · disambiguated record
Chen-Lung Tsai
Also filed as: TSAI CHEN LUNG
22 granted patents·1 pending application·69 citations·filing 2007–2021
92Inventor score
Top patents by PatentIndex Score
23 records- 0197US10955466B2Environment control apparatusONE TEST SYSTEMS·Filed 2020·Granted Mar 23, 2021·31 cites·18 claims
- 0296US11366136B2Pressing assembly and chip testing apparatusONE TEST SYSTEMS·Filed 2021·Granted Jun 21, 2022·4 cites·25 claims
- 0396US11226362B2System-level testing apparatus and system-level testing systemONE TEST SYSTEMS·Filed 2020·Granted Jan 18, 2022·4 cites·20 claims
- 0493US11119147B2Environment control apparatus and chip testing systemONE TEST SYSTEMS·Filed 2020·Granted Sep 14, 2021·3 cites·28 claims
- 0593US10726183B1Testing apparatusONE TEST SYSTEMS·Filed 2019·Granted Jul 28, 2020·6 cites·13 claims
- 0692US11183265B2Environment control apparatusONE TEST SYSTEMS·Filed 2020·Granted Nov 23, 2021·3 cites·18 claims
- 0789US11327111B2Environment control apparatus and chip testing systemONE TEST SYSTEMS·Filed 2020·Granted May 10, 2022·2 cites·19 claims
- 0882US11366155B2Chip testing device and chip testing system for testing memory chipsONE TEST SYSTEMS·Filed 2020·Granted Jun 21, 2022·2 cites·18 claims
- 0981US11327110B2Chip testing system for testing chipsONE TEST SYSTEMS·Filed 2020·Granted May 10, 2022·2 cites·11 claims
- 1081US11193971B2Chip testing method for testing chips by chip testing systemONE TEST SYSTEMS·Filed 2020·Granted Dec 7, 2021·2 cites·13 claims
- 1173US11022643B2Testing apparatusONE TEST SYSTEMS·Filed 2019·Granted Jun 1, 2021·1 cites·13 claims
- 1273US8663485B2Method of manufacturing plastic metallized three-dimensional circuitHU CHUAN LING·Filed 2011·Granted Mar 4, 2014·3 cites·13 claims
- 1372US11327866B2Memory test methodONE TEST SYSTEMS·Filed 2020·Granted May 10, 2022·1 cites·9 claims
- 1461US8435837B2Panel based lead frame packaging method and deviceTSAI CHEN LUNG·Filed 2009·Granted May 7, 2013·5 cites·7 claims
- 1551US11630148B2Chip testing apparatusONE TEST SYSTEMS·Filed 2021·Granted Apr 18, 2023·0 cites·17 claims
- 1651US11287466B2Chip testing circuit and testing method thereofONE TEST SYSTEMS·Filed 2020·Granted Mar 29, 2022·0 cites·19 claims
- 1750US11624776B2Temperature adjusting deviceONE TEST SYSTEMS·Filed 2021·Granted Apr 11, 2023·0 cites·10 claims
- 1848US11435396B2Chip testing systemONE TEST SYSTEMS·Filed 2021·Granted Sep 6, 2022·0 cites·18 claims
- 1948US11366159B2Chip tray kit and chip testing apparatusONE TEST SYSTEMS·Filed 2021·Granted Jun 21, 2022·0 cites·20 claims
- 2048US11125809B2Chip testing deviceONE TEST SYSTEMS·Filed 2020·Granted Sep 21, 2021·0 cites·15 claims
- 2145US11029333B2Testing apparatus, chip carrying device, and electrically connecting unitONE TEST SYSTEMS·Filed 2019·Granted Jun 8, 2021·0 cites·13 claims
- 2244US11428711B2Testing apparatusONE TEST SYSTEMS·Filed 2019·Granted Aug 30, 2022·0 cites·9 claims
- 2342US2008169539A1Under bump metallurgy structure of a package and method of making sameADV CHIP ENG TECH INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →