Inventor · disambiguated record
Phil C. Paone
Also filed as: PAONE PHIL · PAONE PHIL C · PAONE PHIL C F · PAONE PHIL CHRISTOPHER
97 granted patents·12 pending applications·454 citations·filing 2004–2019
99Inventor score
Top patents by PatentIndex Score
109 records- 0195US7224633B1eFuse sense circuitIBM·Filed 2005·Granted May 29, 2007·49 cites·17 claims
- 0294US10043568B1Optimizing data approximation analysis using low power circuitryIBM·Filed 2017·Granted Aug 7, 2018·11 cites·7 claims
- 0394US8525245B2eDRAM having dynamic retention and performance tradeoffERICKSON KARL R·Filed 2011·Granted Sep 3, 2013·22 cites·9 claims
- 0494US7336095B2Changing chip function based on fuse statesIBM·Filed 2007·Granted Feb 26, 2008·31 cites·20 claims
- 0593US10037792B1Optimizing data approximation analysis using low power circuitryIBM·Filed 2017·Granted Jul 31, 2018·11 cites·13 claims
- 0693US8816470B2Independently voltage controlled volume of silicon on a silicon on insulator chipERICKSON KARL R·Filed 2011·Granted Aug 26, 2014·16 cites·6 claims
- 0792US10598710B2Cognitive analysis using applied analog circuitsIBM·Filed 2017·Granted Mar 24, 2020·4 cites·13 claims
- 0892US9916890B1Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cellsIBM·Filed 2017·Granted Mar 13, 2018·10 cites·20 claims
- 0991US8754417B2Vertical stacking of field effect transistor structures for logic gatesCHRISTENSEN TODD ALAN·Filed 2012·Granted Jun 17, 2014·12 cites·5 claims
- 1090US9024387B2FinFET with body contactERICKSON KARL R·Filed 2012·Granted May 5, 2015·12 cites·7 claims
- 1190US8492220B2Vertically stacked FETs with series bipolar junction transistorERICKSON KARL R·Filed 2010·Granted Jul 23, 2013·13 cites·1 claims
- 1288US10592209B1Charge-scaling multiplier circuitIBM·Filed 2018·Granted Mar 17, 2020·6 cites·20 claims
- 1387US10418094B2Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cellsIBM·Filed 2018·Granted Sep 17, 2019·6 cites·20 claims
- 1487US7551470B2Non volatile memory RAD-hard (NVM-rh) systemIBM·Filed 2006·Granted Jun 23, 2009·18 cites·20 claims
- 1586US7550789B2Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperableIBM·Filed 2008·Granted Jun 23, 2009·13 cites·15 claims
- 1685US9864006B1Generating a unique die identifier for an electronic chipIBM·Filed 2016·Granted Jan 9, 2018·4 cites·20 claims
- 1785US9245884B1Structure for metal oxide semiconductor capacitorIBM·Filed 2014·Granted Jan 26, 2016·5 cites·11 claims
- 1885US8435851B2Implementing semiconductor SoC with metal via gate node high performance stacked transistorsERICKSON KARL R·Filed 2011·Granted May 7, 2013·7 cites·6 claims
- 1984US10236050B2Optimizing data approximation analysis using low power circuitryIBM·Filed 2018·Granted Mar 19, 2019·4 cites·13 claims
- 2084US10224089B2Optimizing data approximation analysis using low bower circuitryIBM·Filed 2018·Granted Mar 5, 2019·4 cites·7 claims
- 2183US10304522B2Method for low power operation and test using DRAM deviceIBM·Filed 2017·Granted May 28, 2019·6 cites·15 claims
- 2282US9514841B1Implementing eFuse visual security of stored data using EDRAMIBM·Filed 2015·Granted Dec 6, 2016·4 cites·15 claims
- 2382US9018713B2Plural differential pair employing FinFET structureERICKSON KARL R·Filed 2012·Granted Apr 28, 2015·6 cites·6 claims
- 2482US7528646B2Electrically programmable fuse sense circuitIBM·Filed 2006·Granted May 5, 2009·14 cites·1 claims
- 2581US8921199B1Precision IC resistor fabricationIBM·Filed 2013·Granted Dec 30, 2014·5 cites·18 claims
- 2681US7514276B1Aligning stacked chips using resistance assistanceIBM·Filed 2008·Granted Apr 7, 2009·12 cites·1 claims
- 2780US9583403B2Implementing resistance defect performance mitigation using test signature directed self heating and increased voltageIBM·Filed 2015·Granted Feb 28, 2017·2 cites·9 claims
- 2880US7868391B23-D single gate inverterIBM·Filed 2009·Granted Jan 11, 2011·7 cites·8 claims
- 2979US7442583B2Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperableIBM·Filed 2004·Granted Oct 28, 2008·21 cites·17 claims
- 3079US7268577B2Changing chip function based on fuse statesIBM·Filed 2004·Granted Sep 11, 2007·21 cites·11 claims
- 3178US9053889B2Electronic fuse cell and arrayIBM·Filed 2013·Granted Jun 9, 2015·5 cites·15 claims
- 3277US10348320B1Charge-scaling adder circuitIBM·Filed 2018·Granted Jul 9, 2019·3 cites·20 claims
- 3377US7321522B2Securing an integrated circuitIBM·Filed 2006·Granted Jan 22, 2008·9 cites·14 claims
- 3476US9059307B1Method of implementing buried FET below and beside FinFET on bulk substrateIBM·Filed 2014·Granted Jun 16, 2015·2 cites·7 claims
- 3575US7725844B2Method and circuit for implementing eFuse sense amplifier verificationIBM·Filed 2008·Granted May 25, 2010·10 cites·12 claims
- 3674US9252083B2Semiconductor chip with power gating through silicon viasIBM·Filed 2015·Granted Feb 2, 2016·2 cites·7 claims
- 3773US8754499B1Semiconductor chip with power gating through silicon viasIBM·Filed 2013·Granted Jun 17, 2014·3 cites·20 claims
- 3872US9646712B1Implementing eFuse visual security of stored data using EDRAMIBM·Filed 2016·Granted May 9, 2017·2 cites·5 claims
- 3972US8890083B2Soft error detectionPAONE PHIL C·Filed 2012·Granted Nov 18, 2014·4 cites·18 claims
- 4071US8953365B2Capacitor backup for SRAMIBM·Filed 2013·Granted Feb 10, 2015·3 cites·13 claims
- 4171US7489572B2Method for implementing eFuse sense amplifier testing without blowing the eFuseIBM·Filed 2007·Granted Feb 10, 2009·6 cites·11 claims
- 4270US9099164B2Capacitor backup for SRAMIBM·Filed 2013·Granted Aug 4, 2015·3 cites·5 claims
- 4370US9040406B2Semiconductor chip with power gating through silicon viasIBM·Filed 2013·Granted May 26, 2015·2 cites·13 claims
- 4469US10671348B2Charge-scaling multiplier circuit with dual scaled capacitor setsIBM·Filed 2018·Granted Jun 2, 2020·1 cites·20 claims
- 4569US8735975B2Implementing semiconductor soc with metal via gate node high performance stacked transistorsIBM·Filed 2013·Granted May 27, 2014·2 cites·8 claims
- 4668US8314001B2Vertical stacking of field effect transistor structures for logic gatesCHRISTENSEN TODD ALAN·Filed 2010·Granted Nov 20, 2012·2 cites·3 claims
- 4768US8114747B2Method for creating 3-D single gate inverterPAONE PHIL CHRISTOPHER FELICE·Filed 2010·Granted Feb 14, 2012·3 cites·5 claims
- 4868US7532057B2Electrically programmable fuse sense circuitIBM·Filed 2007·Granted May 12, 2009·4 cites·4 claims
- 4967US8456187B2Implementing temporary disable function of protected circuitry by modulating threshold voltage of timing sensitive circuitERICKSON KARL R·Filed 2011·Granted Jun 4, 2013·2 cites·23 claims
- 5064US10658993B2Charge-scaling multiplier circuit with digital-to-analog converterIBM·Filed 2018·Granted May 19, 2020·1 cites·20 claims
Showing the top 50 of 109 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →