Inventor · disambiguated record
Francois Ducaroir
Also filed as: DUCAROIR FRANCOIS
14 granted patents·725 citations·filing 1995–2002
95Inventor score
Files withLSI LOGIC CORP14
Top patents by PatentIndex Score
14 records- 0185US6167077AUsing multiple high speed serial lines to transmit high data rates while compensating for overall skewLSI LOGIC CORP·Filed 1997·Granted Dec 26, 2000·153 cites·14 claims
- 0285US5956370AWrap-back test system and methodLSI LOGIC CORP·Filed 1996·Granted Sep 21, 1999·96 cites·20 claims
- 0382US5787114ALoop-back test system and methodLSI LOGIC CORP·Filed 1996·Granted Jul 28, 1998·148 cites·20 claims
- 0481US6061747ASystem for sending data from-and-to a computer monitor using a high speed serial lineLSI LOGIC CORP·Filed 1997·Granted May 9, 2000·61 cites·18 claims
- 0580US6331999B1Serial data transceiver architecture and test method for measuring the amount of jitter within a serial data streamLSI LOGIC CORP·Filed 1998·Granted Dec 18, 2001·49 cites·14 claims
- 0678US5790563ASelf test of core with unpredictable latencyLSI LOGIC CORP·Filed 1997·Granted Aug 4, 1998·44 cites·12 claims
- 0763US6330591B1High speed serial line transceivers integrated into a cache controller to support coherent memory transactions in a loosely coupled networkLSI LOGIC CORP·Filed 1998·Granted Dec 11, 2001·43 cites·16 claims
- 0863US6085257AEnhanced receiving chip for a computer monitorLSI LOGIC CORP·Filed 1997·Granted Jul 4, 2000·26 cites·18 claims
- 0959US5644498ATiming shell generation through netlist reductionLSI LOGIC CORP·Filed 1995·Granted Jul 1, 1997·39 cites·12 claims
- 1057US7342977B2Serial data transmitter with bit doublingLSI LOGIC CORP·Filed 2002·Granted Mar 11, 2008·6 cites·15 claims
- 1157US6208621B1Apparatus and method for testing the ability of a pair of serial data transceivers to transmit serial data at one frequency and to receive serial data at another frequencyLSI LOGIC CORP·Filed 1997·Granted Mar 27, 2001·32 cites·7 claims
- 1247US6341142B2Serial data transceiver including elements which facilitate functional testing requiring access to only the serial data ports, and an associated test methodLSI LOGIC CORP·Filed 1997·Granted Jan 22, 2002·14 cites·11 claims
- 1343US5781038AHigh speed phase locked loop test method and meansLSI LOGIC CORP·Filed 1996·Granted Jul 14, 1998·13 cites·12 claims
- 1429US5896426AProgrammable synchronization characterLSI LOGIC CORP·Filed 1996·Granted Apr 20, 1999·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →