Inventor · disambiguated record
Himanshu Kukreja
Also filed as: KUKREJA HIMANSHU
6 granted patents·2 pending applications·11 citations·filing 2010–2019
74Inventor score
Files withKUKREJA HIMANSHU3FREESCALE SEMICONDUCTOR INC1INTEL CORP1JAIN SIDDHARTHA1LANTIQ BETEILIGUNGS GMBH & CO KG1
Top patents by PatentIndex Score
8 records- 0180US8689068B2Low leakage current operation of integrated circuit using scan chainJAIN SIDDHARTHA·Filed 2011·Granted Apr 1, 2014·6 cites·14 claims
- 0271US11047909B2Inter-domain power element testing using scanMAXLINEAR INC·Filed 2019·Granted Jun 29, 2021·1 cites·20 claims
- 0367US10120026B2On-chip test pattern generationLANTIQ BETEILIGUNGS GMBH & CO KG·Filed 2016·Granted Nov 6, 2018·1 cites·10 claims
- 0460US8832510B2Circuit to reduce peak power during transition fault testing of integrated circuitKUKREJA HIMANSHU·Filed 2011·Granted Sep 9, 2014·2 cites·10 claims
- 0552US10032723B2Metal layer independent version identifierINTEL CORP·Filed 2016·Granted Jul 24, 2018·1 cites·20 claims
- 0636US8504886B2Method for partitioning scan chainKUKREJA HIMANSHU·Filed 2011·Granted Aug 6, 2013·0 cites·5 claims
- 0735US2011179325A1System for boundary scan register chain compressionFREESCALE SEMICONDUCTOR INC·Filed 2010·Application pending·0 cites
- 0831US2013117618A1Scan testing of integrated circuit with clock gating cellsKUKREJA HIMANSHU·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Himanshu Kukreja files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →