Inventor · disambiguated record
Boris L. Druz
Also filed as: DRUZ BORIS · DRUZ BORIS L
17 granted patents·9 pending applications·666 citations·filing 1996–2020
95Inventor score
Top patents by PatentIndex Score
26 records- 0194US6238582B1Reactive ion beam etching method and a thin film head fabricated using the methodVEECO INSTR INC·Filed 1999·Granted May 29, 2001·347 cites·89 claims
- 0291US9978934B2Ion beam etching of STT-RAM structuresVEECO INSTR INC·Filed 2015·Granted May 22, 2018·10 cites·14 claims
- 0389US8835869B2Ion sources and methods for generating an ion beam with controllable ion current density distributionYEVTUKHOV RUSTAM·Filed 2012·Granted Sep 16, 2014·18 cites·15 claims
- 0488US5969470ACharged particle sourceVEECO INSTR INC·Filed 1996·Granted Oct 19, 1999·59 cites·31 claims
- 0587US7557362B2Ion sources and methods for generating an ion beam with a controllable ion current density distributionVEECO INSTR INC·Filed 2007·Granted Jul 7, 2009·12 cites·34 claims
- 0685US10014164B2Ion beam materials processing system with grid short clearing system for gridded ion beam sourceVEECO INSTR INC·Filed 2017·Granted Jul 3, 2018·6 cites·17 claims
- 0785US7183716B2Charged particle source and operation thereofVEECO INSTR INC·Filed 2004·Granted Feb 27, 2007·46 cites·8 claims
- 0885US6716322B1Method and apparatus for controlling film profiles on topographic featuresVEECO INSTR INC·Filed 2002·Granted Apr 6, 2004·33 cites·51 claims
- 0984US10128083B2Ion sources and methods for generating ion beams with controllable ion current density distributions over large treatment areasVEECO INSTR INC·Filed 2016·Granted Nov 13, 2018·4 cites·20 claims
- 1084US6150755ACharged particle source with liquid electrodeVEECO INSTR INC·Filed 1999·Granted Nov 21, 2000·42 cites·11 claims
- 1181US8158016B2Methods of operating an electromagnet of an ion sourceHAYES ALAN V·Filed 2008·Granted Apr 17, 2012·11 cites·26 claims
- 1279US8157976B2Apparatus for cathodic vacuum-arc coating depositionDRUZ BORIS·Filed 2007·Granted Apr 17, 2012·9 cites·19 claims
- 1376US9206500B2Method and apparatus for surface processing of a substrate using an energetic particle beamDRUZ BORIS·Filed 2008·Granted Dec 8, 2015·4 cites·20 claims
- 1474US7879201B2Method and apparatus for surface processing of a substrateVEECO INSTR INC·Filed 2004·Granted Feb 1, 2011·14 cites·15 claims
- 1573US6464891B1Method for repetitive ion beam processing with a carbon containing ion beamVEECO INSTR INC·Filed 1999·Granted Oct 15, 2002·46 cites·28 claims
- 1672US9347127B2Film deposition assisted by angular selective etch on a surfaceDRUZ BORIS L·Filed 2012·Granted May 24, 2016·5 cites·22 claims
- 1763US11466360B2Enhanced cathodic ARC source for ARC plasma depositionVEECO INSTR INC·Filed 2020·Granted Oct 11, 2022·0 cites·13 claims
- 1856US2011089022A1Method and apparatus for surface processing of a substrateVEECO INSTR INC·Filed 2010·Application pending·0 cites
- 1955US2015376776A1Variable-temperature material growth stages and thin film growthVEECO INSTR INC·Filed 2014·Application pending·0 cites
- 2046US2017369984A1Enhanced cathodic arc source for arc plasma depositionVEECO INSTR INC·Filed 2017·Application pending·0 cites
- 2145US2016071708A1Method and apparatus for surface processing of a substrate using an energetic particle beamDRUZ BORIS L·Filed 2015·Application pending·0 cites
- 2245US2016230268A1Film deposition assisted by angular selective etch on a surfaceVEECO INSTR INC·Filed 2016·Application pending·0 cites
- 2341US2006292705A1Method and process for fabricating read sensors for read-write heads in mass storage devicesVEECO INSTR INC·Filed 2005·Application pending·0 cites
- 2439US2013206583A1Method and Apparatus for Surface Processing of a Substrate Using an Energetic Particle BeamVEECO INSTR INC·Filed 2013·Application pending·0 cites
- 2538US2019259559A1Plasma bridge neutralizer for ion beam etchingVEECO INSTR INC·Filed 2019·Application pending·0 cites
- 2630US2012223048A1System for Fabricating a Pattern on Magnetic Recording MediaPARANJPE AJIT·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →