Inventor · disambiguated record
Johann Otto
Also filed as: OTTO JOHANN
11 granted patents·1 pending application·127 citations·filing 1979–2003
90Inventor score
Files withSIEMENS AG11
Top patents by PatentIndex Score
12 records- 0192US4241259AScanning electron microscopeSIEMENS AG·Filed 1979·Granted Dec 23, 1980·32 cites·2 claims
- 0279US4963823AElectron beam measuring instrumentSIEMENS AG·Filed 1989·Granted Oct 16, 1990·24 cites·28 claims
- 0372US4812748AMethod and apparatus for operating a scanning microscopeSIEMENS AG·Filed 1986·Granted Mar 14, 1989·15 cites·9 claims
- 0464US4902966AMethod and apparatus for operating a scanning microscopeSIEMENS AG·Filed 1988·Granted Feb 20, 1990·10 cites·9 claims
- 0556US4677351ACircuit for preventing burn-in spots on the picture screen of a visual displaySIEMENS AG·Filed 1985·Granted Jun 30, 1987·9 cites·17 claims
- 0654US4611119AMethod of emphasizing a subject area in a scanning microscopeSIEMENS AG·Filed 1983·Granted Sep 9, 1986·7 cites·2 claims
- 0746US4689555AMethod for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscopeSIEMENS AG·Filed 1986·Granted Aug 25, 1987·10 cites·35 claims
- 0845US7508290B2Inductive component and use of said componentSIEMENS AG·Filed 2003·Granted Mar 24, 2009·2 cites·20 claims
- 0944US4640626AMethod and apparatus for localizing weak points within an electrical circuitSIEMENS AG·Filed 1985·Granted Feb 3, 1987·11 cites·14 claims
- 1037US4471302AMethod for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probeSIEMENS AG·Filed 1982·Granted Sep 11, 1984·5 cites·3 claims
- 1135US2004246683A1Electrical circuit arrangement comprised of a number of electrically interconnected circuit componentsFiled 2002·Application pending·0 cites
- 1230US4780669AMethod and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuitSIEMENS AG·Filed 1986·Granted Oct 25, 1988·2 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →