Inventor · disambiguated record
Jaime D. Morillo
Also filed as: MORILLO JAIME D
9 granted patents·204 citations·filing 2003–2013
90Inventor score
Top patents by PatentIndex Score
9 records- 0197US7626702B2Overlay target and measurement method using reference and sub-gridsIBM·Filed 2008·Granted Dec 1, 2009·60 cites·11 claims
- 0296US7474401B2Multi-layer alignment and overlay target and measurement methodIBM·Filed 2005·Granted Jan 6, 2009·38 cites·32 claims
- 0394US8339605B2Multilayer alignment and overlay target and measurement methodAUSSCHNITT CHRISTOPHER P·Filed 2010·Granted Dec 25, 2012·11 cites·4 claims
- 0494US6937337B2Overlay target and measurement method using reference and sub-gridsIBM·Filed 2003·Granted Aug 30, 2005·56 cites·14 claims
- 0592US7359054B2Overlay target and measurement method using reference and sub-gridsIBM·Filed 2005·Granted Apr 15, 2008·13 cites·16 claims
- 0690US8107079B2Multi layer alignment and overlay target and measurement methodAUSSCHNITT CHRISTOPHER P·Filed 2010·Granted Jan 31, 2012·6 cites·19 claims
- 0789US7876439B2Multi layer alignment and overlay target and measurement methodIBM·Filed 2008·Granted Jan 25, 2011·8 cites·34 claims
- 0885US9097989B2Target and method for mask-to-wafer CD, pattern placement and overlay measurement and controlAUSSCHNITT CHRISTOPHER P·Filed 2009·Granted Aug 4, 2015·8 cites·15 claims
- 0977US9087740B2Fabrication of lithographic image fields using a proximity stitch metrologyIBM·Filed 2013·Granted Jul 21, 2015·4 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →