Inventor · disambiguated record
Shai Silberstein
Also filed as: SILBERSTEIN SHAI
22 granted patents·4 pending applications·202 citations·filing 2003–2025
95Inventor score
Files withAPPLIED MATERIALS SEA PTE LTD5APPLIED MATERIALS SOUTH EAST A5SILBERSTEIN SHAI4NEGEVTECH LTD3GM GLOBAL TECH OPERATIONS LLC2
Top patents by PatentIndex Score
26 records- 0193US7633041B2Apparatus for determining optimum position of focus of an imaging systemAPPLIED MATERIALS SOUTH EAST A·Filed 2006·Granted Dec 15, 2009·20 cites·10 claims
- 0292US7714998B2Image splitting in optical inspection systemsAPPLIED MATERIALS SOUTH EAST A·Filed 2007·Granted May 11, 2010·34 cites·22 claims
- 0391US7961763B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Jun 14, 2011·14 cites·6 claims
- 0491US7719674B2Image splitting in optical inspection systemsAPPLIED MATERIALS SOUTH EAST A·Filed 2007·Granted May 18, 2010·29 cites·16 claims
- 0588US7659973B2Wafer inspection using short-pulsed continuous broadband illuminationAPPLIED MATERIALS SOUTHEAST AS·Filed 2007·Granted Feb 9, 2010·18 cites·27 claims
- 0686US7804993B2Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all imagesAPPLIED MATERIALS SOUTH EAST A·Filed 2005·Granted Sep 28, 2010·15 cites·8 claims
- 0785US7843559B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Nov 30, 2010·7 cites·16 claims
- 0883US8169484B2Photography-specific digital camera apparatus and methods useful in conjunction therewithSILBERSTEIN SHAI·Filed 2005·Granted May 1, 2012·7 cites·18 claims
- 0981US7973921B2Dynamic illumination in optical inspection systemsAPPLIED MATERIALS SEA PTE LTD·Filed 2008·Granted Jul 5, 2011·10 cites·20 claims
- 1081US7477383B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2006·Granted Jan 13, 2009·5 cites·15 claims
- 1176US8098372B2Optical inspection tool featuring multiple speed modesEITAN GIORA·Filed 2007·Granted Jan 17, 2012·13 cites·20 claims
- 1276US7525659B2System for detection of water defectsNEGEVTECH LTD·Filed 2003·Granted Apr 28, 2009·13 cites·3 claims
- 1375US8135207B2Optical inspection tools featuring parallel post-inspection analysisSILBERSTEIN SHAI·Filed 2008·Granted Mar 13, 2012·6 cites·19 claims
- 1475US7826049B2Inspection tools supporting multiple operating states for multiple detector arrangementsAPPLIED MATERIALS SOUTH EAST A·Filed 2008·Granted Nov 2, 2010·4 cites·27 claims
- 1570US7924420B2Optical inspection including partial scanning of wafersAPPLIED MATERIALS SEA PTE LTD·Filed 2007·Granted Apr 12, 2011·5 cites·21 claims
- 1668US8031931B2Printed fourier filtering in optical inspection toolsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Oct 4, 2011·2 cites·21 claims
- 1763US12229926B2Method and system for deblurring a blurred imageGM GLOBAL TECH OPERATIONS LLC·Filed 2022·Granted Feb 18, 2025·0 cites·20 claims
- 1857US2014168462A1Photography-task-specific digital camera apparatus and methods useful in conjunction therewithSILBERSTEIN SHAI·Filed 2014·Application pending·0 cites
- 1956US12214601B2Detecting a defective nozzle in a digital printing systemLANDA CORP LTD·Filed 2021·Granted Feb 4, 2025·0 cites·12 claims
- 2055US8681226B2Photography-task-specific digital camera apparatus and methods useful in conjunction therewithSILBERSTEIN SHAI·Filed 2012·Granted Mar 25, 2014·0 cites·13 claims
- 2155US2009225307A1Wafer inspection using short-pulsed continuous broadband illuminationNEGEVTECH LTD·Filed 2009·Application pending·0 cites
- 2250US12376608B2Meat analogues and methods of producing the sameREDEFINE MEAT LTD·Filed 2020·Granted Aug 5, 2025·0 cites·8 claims
- 2350US2025312764A1Meat analogues and methods of producing the sameREDEFINE MEAT LTD·Filed 2025·Application pending·0 cites
- 2447US12187027B2Quality control in a digital printing systemLANDA CORP LTD·Filed 2022·Granted Jan 7, 2025·0 cites·20 claims
- 2542US10046715B2Systems and methods for object detectionGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Aug 14, 2018·0 cites·20 claims
- 2637US2012053895A1Method and system for evaluating the condition of a collection of similar elongated hollow objectsAMIR NOAM·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →