Inventor · disambiguated record
Zeynep Toros
Also filed as: TOROS ZEYNEP · TOROS ZEYNEP M
13 granted patents·3 pending applications·105 citations·filing 2001–2009
90Inventor score
Top patents by PatentIndex Score
16 records- 0178US6970382B2System and method for controlling logical value and integrity of data in memory systemsBROADCOM CORP·Filed 2004·Granted Nov 29, 2005·24 cites·25 claims
- 0277US7317480B1Imaging apparatus providing black level compensation of a successive approximation A/D converterMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 8, 2008·15 cites·34 claims
- 0375US7323671B1Method and apparatus for varying a CMOS sensor control voltageESS TECHNOLOGY INC·Filed 2004·Granted Jan 29, 2008·14 cites·26 claims
- 0474US7334211B1Method for designing a CMOS sensor using parametersESS TECHNOLOGY INC·Filed 2004·Granted Feb 19, 2008·22 cites·17 claims
- 0573US7250665B1Method and apparatus for removing electrons from CMOS sensor photodetectorsESS TECHNOLOGY INC·Filed 2004·Granted Jul 31, 2007·14 cites·16 claims
- 0668US7385272B2Method and apparatus for removing electrons from CMOS sensor photodetectorsESS TECHNOLOGY INC·Filed 2007·Granted Jun 10, 2008·2 cites·18 claims
- 0763US7800145B2Method and apparatus for controlling charge transfer in CMOS sensors with a transfer gate work functionESS TECHNOLOGY INC·Filed 2004·Granted Sep 21, 2010·6 cites·12 claims
- 0862US2010118173A1Method and apparatus for controlling charge transfer in CMOS sensors with an implant by the transfer gateESS TECHNOLOGY INC·Filed 2009·Application pending·0 cites
- 0954US7635880B2Method and apparatus for proximate CMOS pixelsESS TECHNOLOGY INC·Filed 2004·Granted Dec 22, 2009·2 cites·11 claims
- 1052US7495274B2Method and apparatus for controlling charge transfer in CMOS sensors with a graded transfer-gate work-functionESS TECHNOLOGY INC·Filed 2004·Granted Feb 24, 2009·1 cites·20 claims
- 1146US7755116B2Method and apparatus for controlling charge transfer in CMOS sensors with an implant by the transfer gateESS TECHNOLOGY INC·Filed 2004·Granted Jul 13, 2010·1 cites·21 claims
- 1244US6842379B2Non-volatile memory apparatus and method capable of controlling the quantity of charge stored in memory cellsBROADCOM CORP·Filed 2003·Granted Jan 11, 2005·4 cites·14 claims
- 1343US7519862B2Software programmable verification tool having a single built-in self-test (BIST) module for testing and debugging multiple memory modules in a device under test (DUT)BROADCOM CORP·Filed 2002·Granted Apr 14, 2009·0 cites·28 claims
- 1443US2007001101A1Programmable rise/fall time control circuitESS TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 1535US6574136B1Reduced leakage memory cellBROADCOM CORP·Filed 2001·Granted Jun 3, 2003·0 cites·13 claims
- 1631US2004073841A1Command set for a software programmable verification tool having a built-in self test (BIST) for testing and debugging an embedded device under test (DUT)Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →