Inventor · disambiguated record
Yasuhiko Fukushima
Also filed as: FUKUSHIMA YASUHIKO
6 granted patents·1 pending application·29 citations·filing 1990–2017
77Inventor score
Top patents by PatentIndex Score
7 records- 0177US9829532B2Semiconductor device and method of diagnosing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 28, 2017·4 cites·20 claims
- 0253US5021733ABurn-in apparatusMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jun 4, 1991·20 cites·7 claims
- 0343US10324123B2Semiconductor device and method of diagnosing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Jun 18, 2019·0 cites·14 claims
- 0443US6785852B2Memory device redundant repair analysis method, recording medium and apparatusRENESAS TECH CORP·Filed 2001·Granted Aug 31, 2004·4 cites·19 claims
- 0538US6576865B2Laser trimming program generation methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 10, 2003·1 cites·2 claims
- 0631US2003221153A1Shmoo plot evaluation method with a relief analysisMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0725US6658637B2Semiconductor device trimming method, semiconductor device trimming apparatus, and method for creating semiconductor device trimming tableMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 2, 2003·0 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Yasuhiko Fukushima files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →