Inventor · disambiguated record
Takao Kawanabe
Also filed as: KAWANABE TAKAO
6 granted patents·201 citations·filing 1982–1993
86Inventor score
Files withHITACHI LTD6
Top patents by PatentIndex Score
6 records- 0187US4609566AMethod and apparatus for repairing defects on a photo-mask patternHITACHI LTD·Filed 1985·Granted Sep 2, 1986·53 cites·25 claims
- 0283US4463073AMethod and apparatus for redressing defective photomaskHITACHI LTD·Filed 1982·Granted Jul 31, 1984·59 cites·16 claims
- 0377US4795720AMethod for producing semiconductor devices and cutting fusesHITACHI LTD·Filed 1987·Granted Jan 3, 1989·48 cites·44 claims
- 0469US5094539AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1989·Granted Mar 10, 1992·22 cites·18 claims
- 0553US5432608AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1993·Granted Jul 11, 1995·11 cites·51 claims
- 0646US5260771AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1991·Granted Nov 9, 1993·8 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →