Inventor · disambiguated record
Brian A. Bryce
Also filed as: BRYCE BRIAN · BRYCE BRIAN A
12 granted patents·60 citations·filing 1993–2016
89Inventor score
Top patents by PatentIndex Score
12 records- 0188US9263664B1Integrating a piezoresistive element in a piezoelectronic transistorIBM·Filed 2014·Granted Feb 16, 2016·5 cites·12 claims
- 0282US9419201B2Integrating a piezoresistive element in a piezoelectronic transistorIBM·Filed 2015·Granted Aug 16, 2016·3 cites·8 claims
- 0381US9444029B2Piezoelectronic transistor with co-planar common and gate electrodesIBM·Filed 2015·Granted Sep 13, 2016·3 cites·12 claims
- 0481US9419203B2Passivation and alignment of piezoelectronic transistor piezoresistorIBM·Filed 2015·Granted Aug 16, 2016·3 cites·12 claims
- 0581US9293687B1Passivation and alignment of piezoelectronic transistor piezoresistorIBM·Filed 2014·Granted Mar 22, 2016·3 cites·8 claims
- 0681US9287489B1Piezoelectronic transistor with co-planar common and gate electrodesIBM·Filed 2014·Granted Mar 15, 2016·3 cites·8 claims
- 0767US9318692B1Self-limited crack etch to prevent device shortingIBM·Filed 2015·Granted Apr 19, 2016·1 cites·20 claims
- 0864US8539611B1Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Sep 17, 2013·1 cites·15 claims
- 0955US5338230AElectrical connector assemblyMOLEX INC·Filed 1993·Granted Aug 16, 1994·21 cites·10 claims
- 1054US9559292B2Self-limited crack etch to prevent device shortingIBM·Filed 2016·Granted Jan 31, 2017·0 cites·15 claims
- 1150US5387134AElectrical connector systemMOLEX INC·Filed 1993·Granted Feb 7, 1995·17 cites·5 claims
- 1246US8893310B2Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Nov 18, 2014·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Brian A. Bryce files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →