Inventor · disambiguated record
Timothy J. Koprowski
Also filed as: KOPROWSKI TIMOTHY J · KOPROWSKI TIMOTHY JOHN
17 granted patents·1 pending application·510 citations·filing 1994–2016
95Inventor score
Files withIBM18
Top patents by PatentIndex Score
18 records- 0195US6327685B1Logic built-in self testIBM·Filed 1999·Granted Dec 4, 2001·130 cites·8 claims
- 0291US6442723B1Logic built-in self test selective signature generationIBM·Filed 1999·Granted Aug 27, 2002·84 cites·24 claims
- 0387US6671838B1Method and apparatus for programmable LBIST channel weightingIBM·Filed 2000·Granted Dec 30, 2003·55 cites·11 claims
- 0483US9389955B1String dataflow error detectionIBM·Filed 2015·Granted Jul 12, 2016·3 cites·1 claims
- 0583US6442720B1Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysisIBM·Filed 1999·Granted Aug 27, 2002·50 cites·14 claims
- 0682US6708305B1Deterministic random LBISTIBM·Filed 2000·Granted Mar 16, 2004·29 cites·20 claims
- 0778US6021514ALimited latch linehold capability for LBIST testingIBM·Filed 1998·Granted Feb 1, 2000·43 cites·11 claims
- 0877US9292398B2Design-based weighting for logic built-in self-testIBM·Filed 2013·Granted Mar 22, 2016·4 cites·6 claims
- 0977US6816990B2VLSI chip test power reductionIBM·Filed 2002·Granted Nov 9, 2004·21 cites·12 claims
- 1074US5479414ALook ahead pattern generation and simulation including support for parallel fault simulation in LSSD/VLSI logic circuit testingIBM·Filed 1994·Granted Dec 26, 1995·36 cites·5 claims
- 1168US6968489B2Pseudo random optimized built-in self-testIBM·Filed 2002·Granted Nov 22, 2005·13 cites·11 claims
- 1268US6125465AIsolation/removal of faults during LBIST testingIBM·Filed 1998·Granted Sep 26, 2000·29 cites·2 claims
- 1358US6629281B1Method and system for at speed diagnostics and bit fail mappingIBM·Filed 2000·Granted Sep 30, 2003·10 cites·8 claims
- 1455US9588838B2String dataflow error detectionIBM·Filed 2016·Granted Mar 7, 2017·0 cites·1 claims
- 1555US9292399B2Design-Based weighting for logic built-in self-testIBM·Filed 2014·Granted Mar 22, 2016·0 cites·14 claims
- 1654US9715420B2String dataflow error detectionIBM·Filed 2015·Granted Jul 25, 2017·0 cites·20 claims
- 1742US6629280B1Method and apparatus for delaying ABIST startIBM·Filed 2000·Granted Sep 30, 2003·3 cites·6 claims
- 1836US2004230882A1Pseudo random LBIST controlsIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →